Patents by Inventor David Patrick Fromm

David Patrick Fromm has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probe tip assembly for scanning probe microscopes
    Patent number: 8136389
    Abstract: A probe assembly for a scanning probe microscope (SPM), a cartridge for a probe assembly for an SPM, and a method of attaching a probe tip to an SPM are described.
    Type: Grant
    Filed: October 31, 2007
    Date of Patent: March 20, 2012
    Assignee: Agilent Technologies, Inc.
    Inventors: Richard Paul Tella, George M. Clifford, Jr., Richard R. Workman, Storrs Townsend Hoen, David Patrick Fromm
  • System for scanning probe microscope input device
    Patent number: 7659509
    Abstract: In accordance with the invention, a computer pointing device is interfaced with an SPM system to provide real time control of the SPM and improve the ease of use.
    Type: Grant
    Filed: October 31, 2006
    Date of Patent: February 9, 2010
    Assignee: Agilent Technologies, Inc.
    Inventors: Richard K. Workman, David Patrick Fromm
  • Time-Tagged Data for Atomic Force Microscopy
    Publication number: 20090139313
    Abstract: A scanning probe microscope and method for using the same are disclosed. The scanning probe microscope includes a probe, an electromechanical actuator that moves the sample relative to the probe, an external interface, and a controller. The probe has a tip that moves in response to an interaction between the tip and a local characteristic of a sample. The external interface provides a connection between the scanning probe microscope and a device external to the scanning probe microscope. The controller records scanning probe microscope data measurements, each scanning probe microscope data measurement including a location of the probe in the three dimensions and a label that uniquely identifies that measurement and allows that measurement to be correlated with data generated by a device that is external to the scanning probe microscope. The unique label could include the time at which the data measurement was made.
    Type: Application
    Filed: December 3, 2007
    Publication date: June 4, 2009
    Inventors: David Patrick Fromm, Richard Kenton Workman, John Paul Flowers
  • Scanning Probe Microscope with Improved Scanning Speed
    Publication number: 20090107222
    Abstract: A scanning probe microscope and method for using the same are disclosed. The scanning probe microscope includes a probe, an electro-mechanical actuator, and a controller. The probe has a tip that moves in response to an interaction between the tip and a local characteristic of a sample. The electro-mechanical actuator moves the sample relative to the probe tip in three dimensions. The controller maintains the probe tip in a fixed relationship with respect to the sample in one of the dimensions, and causes the electro-mechanical actuator to move the sample relative to the probe tip in the other two of the dimensions along a smooth path to generate an image of an object in the sample in an area sampled along the smooth path.
    Type: Application
    Filed: October 29, 2007
    Publication date: April 30, 2009
    Inventors: Daniel Yves Abramovitch, David Patrick Fromm, Dale Schroeder
  • PROBE TIP ASSEMBLY FOR SCANNING PROBE MICROSCOPES
    Publication number: 20090107266
    Abstract: A probe assembly for a scanning probe microscope (SPM), a cartridge for a probe assembly for an SPM, and a method of attaching a probe tip to an SPM are described.
    Type: Application
    Filed: October 31, 2007
    Publication date: April 30, 2009
    Inventors: Richard Paul Tella, George M. Clifford, JR., Richard R. Workman, Storrs Townsend Hoen, David Patrick Fromm
  • SYSTEM FOR SCANNING PROBE MICROSCOPE INPUT DEVICE
    Publication number: 20080142708
    Abstract: In accordance with the invention, a computer pointing device is interfaced with an SPM system to provide real time control of the SPM and improve the ease of use.
    Type: Application
    Filed: October 31, 2006
    Publication date: June 19, 2008
    Inventors: Richard K. Workman, David Patrick Fromm