Patents by Inventor David Paul Bowyer

David Paul Bowyer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Automated test system employing robotics
    Patent number: 10948534
    Abstract: An example test system includes robotics configured to operate on devices at a first level of precision, and stages configured to operate at levels of precision that are less than the first level of precision. Each of the stages may include parallel paths that are configured to pass the devices between adjacent stages.
    Type: Grant
    Filed: August 28, 2017
    Date of Patent: March 16, 2021
    Assignee: TERADYNE, INC.
    Inventors: David Paul Bowyer, Jianfa Pei, John P. Toscano, Philip Campbell, Valquirio N. Carvalho
  • Automated test system having orthogonal robots
    Patent number: 10845410
    Abstract: An example test system includes a test carrier to hold devices for test; a device shuttle to transport the devices; and a robot to move the devices between the test carrier and the device shuttle. The device shuttle is configured to move, towards a stage of the test system containing the robot, a first device among the devices that has not been tested. The device shuttle is configured to move in a first dimension. The robot is configured to move the first device from the device shuttle to the test carrier. The robot is configured to move in a second dimension that is different from the first dimension.
    Type: Grant
    Filed: August 28, 2017
    Date of Patent: November 24, 2020
    Assignee: TERADYNE, INC.
    Inventors: David Paul Bowyer, Jianfa Pei, John P. Toscano, Philip Campbell, Marc LeSueur Smith
  • Automated test system having multiple stages
    Patent number: 10725091
    Abstract: An example test system includes: a test rack including test slots; first and second shuttles that are configured to move contemporaneously to transport devices towards and away from trays, with at least some of the devices having been tested and at least some of the devices to be tested; first and second robots that are configured to move contemporaneously to move the devices that have been tested from test sockets in test carriers to the first and second shuttles, and to move the devices to be tested from the first and second shuttles to the test sockets in test carriers; and first and second test arms that are configured to move contemporaneously to move the test carriers between the first and second robots and the test rack.
    Type: Grant
    Filed: August 28, 2017
    Date of Patent: July 28, 2020
    Assignee: TERADYNE, INC.
    Inventors: David Paul Bowyer, Jianfa Pei, John P. Toscano, Philip Campbell, Marc LeSueur Smith
  • AUTOMATED TEST SYTEM HAVING MULTIPLE STAGES
    Publication number: 20190064252
    Abstract: An example test system includes: a test rack including test slots; first and second shuttles that are configured to move contemporaneously to transport devices towards and away from trays, with at least some of the devices having been tested and at least some of the devices to be tested; first and second robots that are configured to move contemporaneously to move the devices that have been tested from test sockets in test carriers to the first and second shuttles, and to move the devices to be tested from the first and second shuttles to the test sockets in test carriers; and first and second test arms that are configured to move contemporaneously to move the test carriers between the first and second robots and the test rack.
    Type: Application
    Filed: August 28, 2017
    Publication date: February 28, 2019
    Inventors: David Paul Bowyer, Jianfa Pei, John P. Toscano, Philip Campbell, Marc LeSueur Smith
  • AUTOMATED TEST SYSTEM EMPLOYING ROBOTICS
    Publication number: 20190064254
    Abstract: An example test system includes robotics configured to operate on devices at a first level of precision, and stages configured to operate at levels of precision that are less than the first level of precision. Each of the stages may include parallel paths that are configured to pass the devices between adjacent stages.
    Type: Application
    Filed: August 28, 2017
    Publication date: February 28, 2019
    Inventors: David Paul Bowyer, Jianfa Pei, John P. Toscano, Philip Campbell, Valquirio N. Carvalho
  • AUTOMATED TEST SYTEM HAVING ORTHOGONAL ROBOTS
    Publication number: 20190064261
    Abstract: An example test system includes a test carrier to hold devices for test; a device shuttle to transport the devices; and a robot to move the devices between the test carrier and the device shuttle. The device shuttle is configured to move, towards a stage of the test system containing the robot, a first device among the devices that has not been tested. The device shuttle is configured to move in a first dimension. The robot is configured to move the first device from the device shuttle to the test carrier. The robot is configured to move in a second dimension that is different from the first dimension.
    Type: Application
    Filed: August 28, 2017
    Publication date: February 28, 2019
    Inventors: David Paul Bowyer, Jianfa Pei, John P. Toscano, Philip Campbell, Marc LeSueur Smith