Patents by Inventor David R. Cuthbert
David R. Cuthbert has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7705677Abstract: The frequency and transient responses of a CMOS differential amplifier are improved by employing one or more compensating capacitors. A compensating capacitor coupled to a differential input of the CMOS differential amplifier is used to inject current into the differential input, such that the net current flow through the gate-to-drain capacitance of a MOS input transistor approaches zero. Thus, the Miller effect with respect to that MOS input transistor is substantially reduced or eliminated, resulting in increased frequency and transient responses for the CMOS differential amplifier. In one embodiment, the CMOS differential amplifier is a CMOS current mirror differential amplifier.Type: GrantFiled: July 21, 2008Date of Patent: April 27, 2010Assignee: Micron Technology, Inc.Inventors: Leonard Forbes, David R. Cuthbert
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Patent number: 7629858Abstract: One aspect relates to an oscillator, and various oscillator embodiments comprise an amplifier and line driver with an input and an output and a transmission line with a predetermined transmission signal time delay. The output is adapted to produce an inverted signal with respect to a signal received at the input. The transmission line has a first end connected to the output and a second end connected to the input. Other aspects and embodiments are provided herein.Type: GrantFiled: September 13, 2007Date of Patent: December 8, 2009Assignee: Micron Technology, Inc.Inventors: Leonard Forbes, David R. Cuthbert
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Patent number: 7498875Abstract: The present invention comprises switched capacitor amplifiers including positive feedback on semiconductor devices, wafers, and systems incorporating same and methods for amplifying signals using positive feedback, while maintaining a stable gain and producing an improved signal-to-noise ratio. One embodiment includes a switched capacitor amplifier comprising a CMOS amplifier, a feed-in switched capacitor, and a feedback switched capacitor. The feed-in switched capacitor couples an input signal to the non-inverting input of the CMOS amplifier. Similarly, the feedback switched capacitor couples the amplifier output to the non-inverting input to create a positive feedback loop. A capacitance of the feedback switched capacitor relative to a capacitance of the feed-in switched capacitor comprises a feedback proportion.Type: GrantFiled: August 31, 2007Date of Patent: March 3, 2009Assignee: Micron Technology, Inc.Inventors: Leonard Forbes, David R. Cuthbert
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Publication number: 20080297249Abstract: The frequency and transient responses of a CMOS differential amplifier are improved by employing one or more compensating capacitors. A compensating capacitor coupled to a differential input of the CMOS differential amplifier is used to inject current into the differential input, such that the net current flow through the gate-to-drain capacitance of a MOS input transistor approaches zero. Thus, the Miller effect with respect to that MOS input transistor is substantially reduced or eliminated, resulting in increased frequency and transient responses for the CMOS differential amplifier. In one embodiment, the CMOS differential amplifier is a CMOS current mirror differential amplifier.Type: ApplicationFiled: July 21, 2008Publication date: December 4, 2008Inventors: Leonard Forbes, David R. Cuthbert
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Patent number: 7453751Abstract: A memory sense amplifier includes a sample and hold circuit followed by a differential amplifier. The sample and hold circuit samples a reference voltage on a bit line of a memory circuit when the sense amplifier is reset and a signal voltage on the same bit line when a signal representing a data bit is present in the bit line. The differential amplifier amplifies the difference between the signal voltage and the reference voltage.Type: GrantFiled: July 12, 2006Date of Patent: November 18, 2008Assignee: Micron Technology, Inc.Inventors: Leonard Forbes, David R. Cuthbert
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Patent number: 7417505Abstract: The frequency and transient responses of a CMOS differential amplifier are improved by employing one or more compensating capacitors. A compensating capacitor coupled to a differential input of the CMOS differential amplifier is used to inject current into the differential input, such that the net current flow through the gate-to-drain capacitance of a MOS input transistor approaches zero. Thus, the Miller effect with respect to that MOS input transistor is substantially reduced or eliminated, resulting in increased frequency and transient responses for the CMOS differential amplifier. In one embodiment, the CMOS differential amplifier is a CMOS current mirror differential amplifier.Type: GrantFiled: July 27, 2006Date of Patent: August 26, 2008Assignee: Micron Technology, Inc.Inventors: Leonard Forbes, David R. Cuthbert
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Patent number: 7339431Abstract: The frequency and transient responses of a CMOS differential amplifier are improved by employing one or more compensating capacitors. A compensating capacitor coupled to a differential input of the CMOS differential amplifier is used to inject current into the differential input, such that the net current flow through the gate-to-drain capacitance of a MOS input transistor approaches zero. Thus, the Miller effect with respect to that MOS input transistor is substantially reduced or eliminated, resulting in increased frequency and transient responses for the CMOS differential amplifier. In one embodiment, the CMOS differential amplifier is a CMOS current mirror differential amplifier.Type: GrantFiled: January 30, 2007Date of Patent: March 4, 2008Assignee: Micron Technology, Inc.Inventors: Leonard Forbes, David R. Cuthbert
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Patent number: 7339423Abstract: The present invention comprises switched capacitor amplifiers including positive feedback on semiconductor devices, wafers, and systems incorporating same and methods for amplifying signals using positive feedback, while maintaining a stable gain and producing an improved signal-to-noise ratio. One embodiment includes a switched capacitor amplifier comprising a CMOS amplifier, a feed-in switched capacitor, and a feedback switched capacitor. The feed-in switched capacitor couples an input signal to the non-inverting input of the CMOS amplifier. Similarly, the feedback switched capacitor couples the amplifier output to the non-inverting input to create a positive feedback loop. A capacitance of the feedback switched capacitor relative to a capacitance of the feed-in switched capacitor comprises a feedback proportion.Type: GrantFiled: March 26, 2007Date of Patent: March 4, 2008Assignee: Micron Technology, Inc.Inventors: Leonard Forbes, David R. Cuthbert
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Patent number: 7294790Abstract: Apparatus is provided for measuring the potential for mutual coupling in an integrated circuit package of any type or configuration using a network analyzer in conjunction with a coaxial test probe. Simple, low-cost test fixturing and methods of testing may be used to measure the parasitic capacitance and inductance of one or more I/O leads of an integrated circuit package, the measured parasitic capacitances and inductances providing an indication of the susceptibility of the integrated circuit package to mutual coupling between electrical leads of the package or between an electrical lead and other components of the integrated circuit package.Type: GrantFiled: February 13, 2003Date of Patent: November 13, 2007Assignee: Micron Technology, Inc.Inventors: Mark T. Van Horn, Richard N. Hedden, David R. Cuthbert, Aaron M. Schoenfeld
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Patent number: 7295081Abstract: One aspect relates to an oscillator, and various oscillator embodiments comprise an amplifier and line driver with an input and an output and a transmission line with a predetermined transmission signal time delay. The output is adapted to produce an inverted signal with respect to a signal received at the input. The transmission line has a first end connected to the output and a second end connected to the input. Other aspects and embodiments are provided herein.Type: GrantFiled: August 29, 2005Date of Patent: November 13, 2007Assignee: Micron Technology, Inc.Inventors: Leonard Forbes, David R. Cuthbert
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Patent number: 7271581Abstract: An integrated circuit characterization printed circuit board and method is provided for improving the uniformity of impedance introduced by a test fixture across all of the pins of the integrated circuit device. The printed circuit board includes an array of substantially similar test contacts numbering greater than the pins of the integrated circuit device. The array of test contacts includes an active portion configured for electrically coupling with the corresponding pins on the integrated circuit device and an inactive portion adjacent to the active portion and electrically coupled to a reference signal on the printed circuit board.Type: GrantFiled: April 2, 2003Date of Patent: September 18, 2007Assignee: Micron Technology, Inc.Inventors: William J. Casey, David R. Cuthbert, Olivia I. McGrew
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Patent number: 7239152Abstract: Apparatus and methods are provided for measuring the potential for mutual coupling in an integrated circuit package of any type or configuration using a network analyzer in conjunction with a coaxial test probe. Simple, low-cost test fixturing and methods of testing may be used to measure the parasitic capacitance and inductance of one or more I/O leads of an integrated circuit package, the measured parasitic capacitances and inductances providing an indication of the susceptibility of the integrated circuit package to mutual coupling between electrical leads of the package or between an electrical lead and other components of the integrated circuit package.Type: GrantFiled: June 22, 2004Date of Patent: July 3, 2007Assignee: Micron Technology, Inc.Inventors: Mark T. Van Horn, Richard N. Hedden, David R. Cuthbert, Aaron M. Schoenfeld
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Patent number: 7236415Abstract: A memory sense amplifier includes a sample and hold circuit followed by a differential amplifier. The sample and hold circuit samples a reference voltage on a bit line of a memory circuit when the sense amplifier is reset and a signal voltage on the same bit line when a signal representing a data bit is present in the bit line. The differential amplifier amplifies the difference between the signal voltage and the reference voltage.Type: GrantFiled: September 1, 2004Date of Patent: June 26, 2007Assignee: Micron Technology, Inc.Inventors: Leonard Forbes, David R. Cuthbert
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Patent number: 7230479Abstract: The present invention comprises switched capacitor amplifiers including positive feedback, semiconductor devices, wafers and systems incorporating same and methods for amplifying signals using positive feedback, while maintaining a stable gain and producing an improved signal-to-noise ratio. One embodiment includes a switched capacitor amplifier comprising a Complementary Metal Oxide Semiconductor (CMOS) amplifier, a feed-in switched capacitor, and a feedback switched capacitor. The feed-in switched capacitor operably couples an input signal to the non-inverting input of the CMOS amplifier. Similarly, the feedback switched capacitor operably couples the amplifier output to the non-inverting input to create a positive feedback loop. A capacitance of the feedback switched capacitor relative to a capacitance of the feed-in switched capacitor comprises a feedback proportion.Type: GrantFiled: August 3, 2005Date of Patent: June 12, 2007Assignee: Micron Technology, Inc.Inventors: Leonard Forbes, David R. Cuthbert
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Patent number: 7212013Abstract: Apparatus and methods are provided for measuring the potential for mutual coupling in an integrated circuit package of any type or configuration using a network analyzer in conjunction with a coaxial test probe. Simple, low-cost test fixturing and methods of testing may be used to measure the parasitic capacitance and inductance of one or more I/O leads of an integrated circuit package, the measured parasitic capacitances and inductances providing an indication of the susceptibility of the integrated circuit package to mutual coupling between electrical leads of the package or between an electrical lead and other components of the integrated circuit package.Type: GrantFiled: March 18, 2005Date of Patent: May 1, 2007Assignee: Micron Technology, Inc.Inventors: Mark T. Van Horn, Richard N. Hedden, David R. Cuthbert, Aaron M. Schoenfeld
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Patent number: 7208959Abstract: Methods are provided for measuring the potential for mutual coupling in an integrated circuit package of any type or configuration using a network analyzer in conjunction with a coaxial test probe. Simple, low-cost test fixturing and methods of testing may be used to measure the parasitic capacitance and inductance of one or more I/O leads of an integrated circuit package, the measured parasitic capacitances and inductances providing an indication of the susceptibility of the integrated circuit package to mutual coupling between electrical leads of the package or between an electrical lead and other components of the integrated circuit package.Type: GrantFiled: November 7, 2005Date of Patent: April 24, 2007Assignee: Micron Technology, Inc.Inventors: Mark T. Van Horn, Richard N. Hedden, David R. Cuthbert, Aaron M. Schoenfeld
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Patent number: 7208935Abstract: Apparatus and methods are provided for measuring the potential for mutual coupling in an integrated circuit package of any type or configuration using a network analyzer in conjunction with a coaxial test probe. Simple, low-cost test fixturing and methods of testing may be used to measure the parasitic capacitance and inductance of one or more I/O leads of an integrated circuit package, the measured parasitic capacitances and inductances providing an indication of the susceptibility of the integrated circuit package to mutual coupling between electrical leads of the package or between an electrical lead and other components of the integrated circuit package.Type: GrantFiled: February 13, 2003Date of Patent: April 24, 2007Assignee: Micron Technology, Inc.Inventors: Mark T. Van Horn, Richard N. Hedden, David R. Cuthbert, Aaron M. Schoenfeld
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Patent number: 7202739Abstract: The frequency and transient responses of a CMOS differential amplifier are improved by employing one or more compensating capacitors. A compensating capacitor coupled to a differential input of the CMOS differential amplifier is used to inject current into the differential input, such that the net current flow through the gate-to-drain capacitance of a MOS input transistor approaches zero. Thus, the Miller effect with respect to that MOS input transistor is substantially reduced or eliminated, resulting in increased frequency and transient responses for the CMOS differential amplifier. In one embodiment, the CMOS differential amplifier is a CMOS current mirror differential amplifier.Type: GrantFiled: July 27, 2006Date of Patent: April 10, 2007Assignee: Micron Technology, Inc.Inventors: Leonard Forbes, David R. Cuthbert
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Patent number: 7199593Abstract: Apparatus and methods are provided for measuring the potential for mutual coupling in an integrated circuit package of any type or configuration using a network analyzer in conjunction with a coaxial test probe. Simple, low-cost test fixturing and methods of testing may be used to measure the parasitic capacitance and inductance of one or more I/O leads of an integrated circuit package, the measured parasitic capacitances and inductances providing an indication of the susceptibility of the integrated circuit package to mutual coupling between electrical leads of the package or between an electrical lead and other components of the integrated circuit package.Type: GrantFiled: March 18, 2005Date of Patent: April 3, 2007Assignee: Micron Technology, Inc.Inventors: Mark T. Van Horn, Richard N. Hedden, David R. Cuthbert, Aaron M. Schoenfeld
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Patent number: 7180370Abstract: The frequency and transient responses of a CMOS differential amplifier are improved by employing one or more compensating capacitors. A compensating capacitor coupled to a differential input of the CMOS differential amplifier is used to inject current into the differential input, such that the net current flow through the gate-to-drain capacitance of a MOS input transistor approaches zero. Thus, the Miller effect with respect to that MOS input transistor is substantially reduced or eliminated, resulting in increased frequency and transient responses for the CMOS differential amplifier. In one embodiment, the CMOS differential amplifier is a CMOS current mirror differential amplifier.Type: GrantFiled: September 1, 2004Date of Patent: February 20, 2007Assignee: Micron Technology, Inc.Inventors: Leonard Forbes, David R. Cuthbert