Abstract: A test head for a semiconductor integrated circuit tester includes a main support structure defining a device interface board location, and a contact support frame that is displaceable relative to the main support structure for engaging a device interface board at the device interface board location.

Abstract: An interconnection structure includes a positioning block and a dielectric substrate. A coaxial cable has an end segment that is fitted in a passage in the positioning block and the positioning block is so positioned relative to the dielectric substrate that an end face of the inner conductor of the coaxial cable is presented towards a conductive element on a main face of the substrate. A discrete resilient contact element is interposed between the end face of the inner conductor and the conductive element and in electrically-conductive pressure contact with both the inner conductor and the conductive element.

Abstract: A connector for connecting internal circuitry of a bar code scanner to a connector plug. One end of a contact assembly is used together with a scanner chassis to form a receptacle for receiving the plug. The other end of the contact assembly connects with the internal circuitry. The contact assembly includes a plurality of wires with a ground wire that is bent to contact a scanner casing upon insertion of the contact assembly into the scanner casing. Two or more of the wires have lateral protrusions extending toward each other to provide points at which arcing is most likely in the event of an increased surge of current. One of the wires with the protrusions is also the wire that is bent outward so that any arcing is grounded to the scanner casing.

Abstract: A tip assembly for a bar code scanner having a concentric design which prevents rotational, axial and tilting movement among the components of the tip assembly. A tip housing with an internal detent is snap fitted over a scanner housing having multiple cantilevered, flexible beams, each with a circumferential groove adapted to receive the detent therein. An optical assembly housing containing optics is received within the scanner housing, between the flexible beams thereof. The optical assembly housing has tabs extending outwardly to mate with corresponding recesses in the beams to prevent rotation of the optical assembly relative to the scanner housing. The tip housing is sized to frictionally engage and press the beams inward so they frictionally engage the optical assembly housing. A scanner barrel is positioned about the scanner housing and extends to a position outward of the lip portion of the tip housing to prevent outward travel of the beams, thus locking the tip assembly components securely together.