Patents by Inventor David Roddom

David Roddom has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of operating a charged particle microscope and charged particle microscope operating according to such method
    Patent number: 9916964
    Abstract: A method of operating a charged particle microscope comprises: providing settings of a focus, an x-stigmator and an y-stigmator of the charged particle microscope; and then repeatedly performing adjusting the charged particle microscope to the settings, recording an image of an object using the settings, determining a sharpness measure from the recorded image, and changing at least one of the settings of the focus, the x-stigmator and the y-stigmator based on the sharpness measure until a stop criterion is fulfilled. Herein, the determining of the sharpness measure comprises: determining an orientation of an intensity gradient at each of a plurality of locations within one of the recorded image and a processed image generated by processing the recorded image, and determining the sharpness measure based on the plurality of determined orientations.
    Type: Grant
    Filed: August 24, 2016
    Date of Patent: March 13, 2018
    Assignees: CARL ZEISS MICROSCOPY GMBH, CARL ZEISS MICROSCOPY LTD.
    Inventors: Simon Diemer, Janina Schulz, Emanuel Heindl, David Roddom
  • Method of operating a charged particle microscope and charged particle microscope operating according to such method
    Patent number: 9437394
    Abstract: A method of operating a charged particle microscope comprises: providing settings of a focus, an x-stigmator and an y-stigmator of the charged particle microscope; and then repeatedly performing adjusting the charged particle microscope to the settings, recording an image of an object using the settings, determining a sharpness measure from the recorded image, and changing at least one of the settings of the focus, the x-stigmator and the y-stigmator based on the sharpness measure until a stop criterion is fulfilled. Herein, the determining of the sharpness measure comprises: determining an orientation of an intensity gradient at each of a plurality of locations within one of the recorded image and a processed image generated by processing the recorded image, and determining the sharpness measure based on the plurality of determined orientations.
    Type: Grant
    Filed: March 28, 2014
    Date of Patent: September 6, 2016
    Assignees: CARL ZEISS MICROSCOPY LTD., CARL ZEISS MICROSCOPY GMBH
    Inventors: Simon Diemer, Janina Schulz, Emanuel Heindl, David Roddom