Patents by Inventor David Rohde

David Rohde has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12763485
    Abstract: A Hybrid Artificial Magnetic Conductor (AMC) antenna reflector improves performance of an Archimedean spiral antenna across all bands. The AMC reflector provides uni-directional radiation over a 1-5 GHz frequency range. The AMC reflector provides at least 3 dB of gain compared to the same antenna without a reflector. The AMC reflector includes a traditional Perfect Electric Conductor (PEC) reflector portion, used to reflect higher frequencies, and a capacitively loaded AMC reflector portion, used to reflect lower frequencies. The AMC patch size and capacitor values are optimized for best response across the 1-2 GHz frequency range. The center, high frequency section of the AMC reflector portion is removed to provide an optimized standoff distance from the antenna to allow direct reflection from the PEC reflector portion. The AMC reflector reduces the PEC reflector thickness dimension and provides improved antenna pattern symmetry at higher frequencies.
    Type: Grant
    Filed: November 6, 2024
    Date of Patent: October 13, 2026
    Assignee: The United States of America as represented by the Secretary of the Navy
    Inventor: David Rohde
  • Patent number: 6555817
    Abstract: A system and method for correcting automatically the distortions in electron background diffration (EBSD) patterns which result from magnetic fields produced by some scanning electron microscopes (SEMs) used for collecting such patterns from polycrystalline sample materials. The method may be implemented as a software program running on a computer which is part of a conventional system for obtaining and analyzing EBSD patterns to obtain crystallographic information about the sample material. The method includes a calibration procedure and a correction procedure. In the calibration procedure, a distorted EBSD pattern obtained from a calibration sample is displayed on an operator display and user interface. Using an input device, an operator defines segment endpoints along a Kikuchi band in the distorted EBSD pattern image. From the user defined segment endpoints, correction parameters are calculated based on a mathematical curve (e.g., cubic spline) fitting the endpoints.
    Type: Grant
    Filed: May 17, 2000
    Date of Patent: April 29, 2003
    Assignee: Thermo Noran Inc.
    Inventors: David Rohde, Patrick P. Camus