Abstract: The position detector has a sensitivity characteristic graded along a direction transverse to the surface, so that the output of the position detector is used to determine a height of the surface. A surface height detection and positioning device for use in a surface inspection system. An incident beam of light impinges obliquely upon the surface, and a position detector is disposed to receive specularly reflected light, producing a plurality of electrical signals, with a mechanical window, defining an aperture, placed in front of the detector. The aperture's width, along the scan direction, is of sufficient size so as to create a train of signals from each of the plurality of electrical signals, having a frequency equal to the scan frequency. These electrical signals carry information responsive to both the position of reflected beam impinging on the detector and the beam's intensity and are, in turn, related to a height of the surface.

Abstract: In an on-line scanning sensor system, certain components of an FT-IR interferometer are isolated from vibrations that cause inaccuracies in measurements provided by the system, thereby allowing the sensor system to be used on-line in manufacturing environments. More particularly, vibration-absorbing suspension devices suspend selected interferometer components such that the center of suspension of the suspended interferometer component is substantially coincident with the center of gravity of the suspended components.