Patents by Inventor David Scigocki

David Scigocki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8847152
    Abstract: The invention concerns a method for multiplexed tandem mass spectrometry of a sample to be analyzed containing at least two precursors, wherein at least two simplified multiplexed MS-MS spectra are obtained each from at least two selected precursors of the sample, the method comprising: (d) for each selected precursor generating an individual MS-MS spectrum from the simplified multiplexed MS-MS spectrum by selecting fragment ions of the simplified multiplexed MS-MS spectrum, the fragment ions are potential fragment ions obtained from the precursor; (e) submitting each individual MS-MS spectrum of step (d) to a real and a decoy database searches using a scoring process without score threshold condition or low score threshold condition for identifying candidate precursors and their fragment ions; (f) producing real individual MS-MS spectra from identified candidate precursors resulting from the real database search of step (e); and producing decoy individual MS-MS spectra from identified candidate precursors re
    Type: Grant
    Filed: October 29, 2010
    Date of Patent: September 30, 2014
    Assignee: Physikron SA
    Inventor: David Scigocki
  • Publication number: 20120241603
    Abstract: The invention concerns a method for multiplexed tandem mass spectrometry of a sample to be analysed containing at least two precursors, wherein at least two simplified multiplexed MS-MS spectra are obtained each from at least two selected precursors of the sample, the method comprising: (d) for each selected precursor generating an individual MS-MS spectrum from the simplified multiplexed MS-MS spectrum by selecting fragment ions of the simplified multiplexed MS-MS spectrum, the fragment ions are potential fragment ions obtained from the precursor; (e) submitting each individual MS-MS spectrum of step (d) to a real and a decoy database searches using a scoring process without score threshold condition or low score threshold condition for identifying candidate precursors and their fragment ions; (f) producing real individual MS-MS spectra from identified candidate precursors resulting from the real database search of step (e); and producing decoy individual MS-MS spectra from identified candidate precursors re
    Type: Application
    Filed: October 29, 2010
    Publication date: September 27, 2012
    Applicant: PHYSIKRON SA
    Inventor: David Scigocki
  • Patent number: 8143572
    Abstract: The invention proposes a method of tandem mass spectrometry for use in a mass spectrometer having a known characteristic function of the mass-to-charge ratio of the ions to be analysed, characterized in that it comprises the following steps: (a) providing a primary ions source to be analysed, (b) generating a primary mass spectrum of the primary ions, without dissociation, wherein said spectrum contains primary ion peaks of occurrence, (c) from the characteristic function values at the maxima of at least some of said primary mass peaks and from the charge values associated to said peaks, determining correlation laws that all possible multiplets of characteristic function values corresponding to multiplets of charged fragments resulting from the dissociation of parent primary ions of interest corresponding to said primary mass peaks have to meet, (d) concurrently dissociating primary ions of interest associated to primary mass peaks, in order to obtain multiplets of charged fragments from each of said parent p
    Type: Grant
    Filed: July 2, 2007
    Date of Patent: March 27, 2012
    Assignee: Physikron
    Inventor: David Scigocki
  • Publication number: 20090250605
    Abstract: The invention proposes a method of tandem mass spectrometry for use in a mass spectrometer having a known characteristic function of the mass-to-charge ratio of the ions to be analysed, characterized in that it comprises the following steps: (a) providing a primary ions source to be analysed, (b) generating a primary mass spectrum of the primary ions, without dissociation, wherein said spectrum contains primary ion peaks of occurrence, (c) from the characteristic function values at the maxima of at least some of said primary mass peaks and from the charge values associated to said peaks, determining correlation laws that all possible multiplets of characteristic function values corresponding to multiplets of charged fragments resulting from the dissociation of parent primary ions of interest corresponding to said primary mass peaks have to meet, (d) concurrently dissociating primary ions of interest associated to primary mass peaks, in order to obtain multiplets of charged fragments from each of said parent p
    Type: Application
    Filed: July 2, 2007
    Publication date: October 8, 2009
    Inventor: David Scigocki