Patents by Inventor David Tank

David Tank has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11435302
    Abstract: Disclosed are a procedure and system for live monitoring of staining quality and heavy metal diffusion during electron microscopy preparation protocols for biological samples. The disclosed approach employs x-rays via, e.g., a commercially available micro-CT device, to observe and measure the diffusion and distribution of the heavy metals during conventional biological sample staining procedures for electron microscopy. This allows one to observe and check the quality and homogeneity of the staining without damaging or destroying the sample.
    Type: Grant
    Filed: November 12, 2019
    Date of Patent: September 6, 2022
    Assignee: THE TRUSTEES OF PRINCETON UNIVERSITY
    Inventors: Adrian A. Wanner, David Tank, Sebastian Seung
  • Publication number: 20200150063
    Abstract: Disclosed are a procedure and system for live monitoring of staining quality and heavy metal diffusion during electron microscopy preparation protocols for biological samples. The disclosed approach employs x-rays via, e.g., a commercially available micro-CT device, to observe and measure the diffusion and distribution of the heavy metals during conventional biological sample staining procedures for electron microscopy. This allows one to observe and check the quality and homogeneity of the staining without damaging or destroying the sample.
    Type: Application
    Filed: November 12, 2019
    Publication date: May 14, 2020
    Applicant: The Trustees of Princeton University
    Inventors: Adrian A. Wanner, David Tank, Sebastian Seung
  • Publication number: 20050122530
    Abstract: An optical scanning system includes a probe and a processor. The probe includes a mechanical oscillator responsive to AC voltage signals and an optical fiber. The optical fiber has a free end that executes an oscillatory scanning motion in response to being mechanically driven by the mechanical oscillator. The processor is configured to receive measured intensities of light emitted from spots of a sample scanned by light from the free end of the optical fiber. The processor is also configured to assign intensities to image pixels based on the measured intensities of light. The acts of assigning compensate for variations in the density of the scanned spots.
    Type: Application
    Filed: January 12, 2005
    Publication date: June 9, 2005
    Inventors: Winfried Denk, Michale Fee, Fritjof Helmchen, David Tank