Abstract: A method of performing an on-wafer function testis provided for multiple magnetic field sensor elements on a wafer. Each sensor element includes a magnetic-field-sensitive structure and a current conductor structure. The current conductor structure provides a test magnetic field in response to a test signal, and a change in an electrical characteristic of the respective magnetic-field-sensitive structure is sensed. The functionality of the respective magnetic field sensor element is then evaluated based on electrical characteristic change.

Abstract: A method for determining the angular position of a rotating object and rotary encoder is disclosed. In one embodiment, the method includes a method for determining the angular position of an object rotating about a rotation axis in a rotation direction and having a coding pattern, using a sensor that senses the coding pattern, including ascertaining the coarse angular position of the rotating object with respect to the sensor whilst taking account of the coding pattern at a first instant. The exact angular position of the rotating object is ascertained with respect to the sensor whilst taking account of the coarsely ascertained angular position and also whilst taking account of at least one section of the coding pattern which extends counter to the rotation direction proceeding from that location of the coding pattern which is assigned to the coarse angular position. An output signal is provided containing items of information about the exact angular position of the rotating object with respect to the sensor.

Abstract: A magnetic field sensor element includes a permanently magnetizable magnetic field sensor structure with a first and a second sensor element contact, wherein the permanently magnetizable magnetic field sensor structure has permanent magnetization, and wherein a magnetic-field-dependent electrical characteristic of the magnetic field sensor structure can be sensed via the sensor element contacts, and a current conductor structure with a first and a second current conductor contact, wherein the current conductor structure is formed so that a magnetization signal can be applied between the first and the second contact, to obtain a defined magnetization magnetic field component in the magnetic field sensor structure, in order to effect permanent, local magnetization of the magnetic field sensor structure, and so that also a test signal can be applied between the current conductor contacts, to obtain a defined test magnetic field component in the magnetic field sensor structure.

Abstract: A method for determining the angular position of a rotating object and rotary encoder is disclosed. In one embodiment, the method includes a method for determining the angular position of an object rotating about a rotation axis in a rotation direction and having a coding pattern, using a sensor that senses the coding pattern, including ascertaining the coarse angular position of the rotating object with respect to the sensor whilst taking account of the coding pattern at a first instant. The exact angular position of the rotating object is ascertained with respect to the sensor whilst taking account of the coarsely ascertained angular position and also whilst taking account of at least one section of the coding pattern which extends counter to the rotation direction proceeding from that location of the coding pattern which is assigned to the coarse angular position. An output signal is provided containing items of information about the exact angular position of the rotating object with respect to the sensor.

Abstract: A method for adjusting a determination rule for an error compensation of an angle sensor is designed to detect a first component of a direction along a first axis and a second component of a direction along a second axis, and to determine an angle of the direction according to the determination rule based on the first and second components. The method includes: detecting values of component pairs consisting of two predetermined components for the calculation of offset and/or amplitude and/or axis-angle errors. One variant consists of entering the component value pairs into an ellipse equation system, determining at least one ellipse coefficient from the ellipse equation system, and adjusting the determination rule depending on the one determined ellipse coefficient or the plurality of determined ellipse coefficients. A further variant is the determination of selected points, extremums or zero points for the determination of the offset and/or amplitude and/or axis-angle errors.