Patents by Inventor David Tester

David Tester has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7899659
    Abstract: A method for generating a compressed representation of a simulated waveform is disclosed. The method may have the steps of: (a) processing circuit model information, (b) identifying a segment of stable repetition; and (c) generating the compressed representation. Step (a) may generate waveform information representing a simulated waveform occurring in the circuit model. Step (b) may identify the segment in the waveform information. In step (c), the compressed waveform information may define the segment by (i) cycle information representing the waveform cycle and (ii) repetition information representing the stable repetitions of the waveform cycle to form the segment.
    Type: Grant
    Filed: June 2, 2003
    Date of Patent: March 1, 2011
    Assignee: LSI Corporation
    Inventor: David Tester
  • Patent number: 7539680
    Abstract: The invention relates to a method of controlling access to a database of a design. The method may comprise the step of identifying a version of the design by a first identifier, allocating first authorization information to the first identifier, and controlling access to the database. The first authorization information may indicate a permission of one or more users to access information in the database in respect of the first identifier. The access may be controlled in accordance with the first authorization information.
    Type: Grant
    Filed: May 10, 2002
    Date of Patent: May 26, 2009
    Assignee: LSI Corporation
    Inventor: David Tester
  • Patent number: 7091892
    Abstract: An accurate high current mirror circuit produces a mirrored current that matches an input current to produce an accuracy at the output of a subsequent stage of amplification of greater than 0.01%. A plurality of transistor devices are arranged in a symmetrical configuration and divided into two groups. The transistors in each of the two groups are connected in parallel to produce a high mirror current from a high input current. A distribution of a source voltage produces the same source voltage at each of the plurality of transistors. An input current metallization and a mirror current metallization are formed within the symmetrical configuration to have a same value of impedance. A plurality of P-channel transistors within the current mirror circuit control a voltage of a point on the input metallization to be the same as a reference voltage, thus causing the mirror current to be referenced around the reference voltage.
    Type: Grant
    Filed: December 9, 2004
    Date of Patent: August 15, 2006
    Assignee: Dialog Semiconductor GmbH
    Inventors: David Tester, Gary Hague, Jorg Medwed
  • Patent number: 7062695
    Abstract: The present invention may provide a circuit generally having a plurality of addressable memory cells and an access control circuit. The access control circuit may be configured to intercept an access to a faulty cell of the plurality of addressable memory cells. The access control circuit may be further configured to redirect the access to a spare cell of the plurality of addressable memory cells.
    Type: Grant
    Filed: May 23, 2003
    Date of Patent: June 13, 2006
    Assignee: LSI Logic Corporation
    Inventor: David Tester
  • Publication number: 20060119496
    Abstract: An accurate high current mirror circuit produces a mirrored current that matches an input current to produce an accuracy at the output of a subsequent stage of amplification of greater than 0.01%. A plurality of transistor devices are arranged in a symmetrical configuration and divided into two groups. The transistors in each of the two groups are connected in parallel to produce a high mirror current from a high input current. A distribution of a source voltage produces the same source voltage at each of the plurality of transistors. An input current metallization and a mirror current metallization are formed within the symmetrical configuration to have a same value of impedance. A plurality of P-channel transistors within the current mirror circuit control a voltage of a point on the input metallization to be the same as a reference voltage thus causing the mirror current to be referenced around the reference voltage.
    Type: Application
    Filed: December 9, 2004
    Publication date: June 8, 2006
    Inventors: David Tester, Gary Hague, Jorg Medwed
  • Publication number: 20040243372
    Abstract: A method for generating a compressed representation of a simulated waveform is disclosed. The method may have the steps of: (a) processing circuit model information, (b) identifying a segment of stable repetition; and (c) generating the compressed representation. Step (a) may generate waveform information representing a simulated waveform occurring in the circuit model. Step (b) may identify the segment in the waveform information. In step (c), the compressed waveform information may define the segment by (i) cycle information representing the waveform cycle and (ii) repetition information representing the stable repetitions of the waveform cycle to form the segment.
    Type: Application
    Filed: June 2, 2003
    Publication date: December 2, 2004
    Applicant: LSI LOGIC CORPORATION
    Inventor: David Tester
  • Publication number: 20040237009
    Abstract: The present invention may provide a circuit generally having a plurality of addressable memory cells and an access control circuit. The access control circuit may be configured to intercept an access to a faulty cell of the plurality of addressable memory cells. The access control circuit may be further configured to redirect the access to a spare cell of the plurality of addressable memory cells.
    Type: Application
    Filed: May 23, 2003
    Publication date: November 25, 2004
    Applicant: LSI LOGIC CORPORATION
    Inventor: David Tester
  • Patent number: 6741670
    Abstract: A counter stage generally comprises a flip-flop and a reset circuit. The flip-flop may be configured to toggle a flip-flop signal between a first and a second state in response to a count signal applied to a clock input to effect a counting operation. The reset circuit may be configured to reset the counter stage to a predetermined state without changing the state of the flip-flop signal.
    Type: Grant
    Filed: April 29, 2002
    Date of Patent: May 25, 2004
    Assignee: LSI Logic Corporation
    Inventor: David Tester
  • Patent number: 6683551
    Abstract: The invention may relate to a digital to analog converter. The digital to analog converter may comprise a plurality of controllable current sources and a control circuit. The plurality of controllable current sources may include a first and a second controllable current source. Each of the plurality of controllable current sources may be controllable between a first state and a second state. The control circuit may be coupled to the plurality of controllable current sources. The control circuit may be configured to control digital to analog conversion at a sampling interval. The control circuit may be configured to control a first state transition of the first controllable current source at a timing in the sampling interval different from a second state transition of the second controllable current source.
    Type: Grant
    Filed: August 15, 2002
    Date of Patent: January 27, 2004
    Assignee: LSI Logic Corporation
    Inventors: David Tester, Timothy Wilson
  • Patent number: 6650266
    Abstract: The present invention may relate to a digital to analog converter for converting a digital signal to an analog signal. The digital to analog converter may comprise decoder logic, an array of clocked sub-circuits, a clock generator and a clock signal controller. The decoder logic may be configured to decode the digital signal to a plurality of control signals for controlling generation of the analog signal. The array of clocked sub-circuits may be configured to receive the control signals. The clock generator may be configured to generate a clock signal for clocking the sub-circuits. The clock signal controller may be configured to inhibit application of the clock signal to one or more of the sub-circuits.
    Type: Grant
    Filed: September 3, 2002
    Date of Patent: November 18, 2003
    Assignee: LSI Logic Corporation
    Inventor: David Tester
  • Publication number: 20030212718
    Abstract: The invention relates to a method of controlling access to a database of a design. The method may comprise the step of identifying a version of the design by a first identifier, allocating first authorization information to the first identifier, and controlling access to the database. The first authorization information may indicate a permission of one or more users to access information in the database in respect of the first identifier. The access may be controlled in accordance with the first authorization information.
    Type: Application
    Filed: May 10, 2002
    Publication date: November 13, 2003
    Applicant: LSI LOGIC CORPORATION
    Inventor: David Tester
  • Publication number: 20030202628
    Abstract: A counter stage generally comprises a flip-flop and a reset circuit. The flip-flop may be configured to toggle a flip-flop signal between a first and a second state in response to a count signal applied to a clock input to effect a counting operation. The reset circuit may be configured to reset the counter stage to a predetermined state without changing the state of the flip-flop signal.
    Type: Application
    Filed: April 29, 2002
    Publication date: October 30, 2003
    Applicant: LSI LOGIC CORPORATION
    Inventor: David Tester