Abstract: A test head for a semiconductor integrated circuit tester includes a main support structure defining a device interface board location, and a contact support frame that is displaceable relative to the main support structure for engaging a device interface board at the device interface board location.

Abstract: An interconnection structure includes a positioning block and a dielectric substrate. A coaxial cable has an end segment that is fitted in a passage in the positioning block and the positioning block is so positioned relative to the dielectric substrate that an end face of the inner conductor of the coaxial cable is presented towards a conductive element on a main face of the substrate. A discrete resilient contact element is interposed between the end face of the inner conductor and the conductive element and in electrically-conductive pressure contact with both the inner conductor and the conductive element.

Abstract: A portable, hand agitated, transparent, random selector device has a spherical mixing chamber, with a plurality of ejectable indicator units therein. A fluid-carrying tubular conduit extends through the chamber, with an aperture in the conduit for receiving the units, one at a time. The conduit has a first and second end terminating outside of the chamber. Fluid, such as the breath of the user, is blown into the first conduit end and carries the indicator units, along with the fluid out to the second end.