Patents by Inventor David Tuschell

David Tuschell has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20060001869
    Abstract: The disclosure is generally directed to a method and apparatus for providing an image of a sample. The apparatus includes an illuminating source for transmitting photons to a sample. The transmitted photons illuminate the sample or are scattered upon reaching the sample. A lens collects the scattered photons and transmits the scattered photons to a tunable filter for forming an image. The illuminating photons traveling from the illuminating source to the sample do not pass through the lens.
    Type: Application
    Filed: June 30, 2004
    Publication date: January 5, 2006
    Inventors: David Tuschel, Wesley Hutchison, Myles Berkman
  • Publication number: 20050030545
    Abstract: The disclosure generally relates to a method and apparatus for compact Fabry-Perot imaging spectrometer. More specifically, in one embodiment, the disclosure concerns a tunable Fabry-Perot optical filter for providing a spatially accurate wavelength-resolved image of a sample having two spatial dimensions. The optical filter may include plural filter elements having an initial predetermined spacing between adjacent filter elements; and a micro electromechanical system (“MEMS”) actuator. One of the plural filter elements may be attached to the MEMS actuator so that the actuator is capable of moving said one filter element relative to another of said plural filter elements to thereby tune said Fabry-Perot optical filter.
    Type: Application
    Filed: July 19, 2004
    Publication date: February 10, 2005
    Inventors: David Tuschel, Patrick Treado, Chenhui Wang
  • Publication number: 20050018013
    Abstract: Authentication systems, apparatus, and methods authenticate an identification marking including a nanocrystalline material. One or more properties of the marking are ascertained to provide a measured profile. The measured profile is compared to at least one member of a closed set of reference profiles. Each reference profile has predetermined values of one or more properties. Each reference profile is unique within the set. At least one reference profile is characteristic of an indicator material in a nanocrystalline morphology and non-characteristic of the same indicator material in a bulk morphology.
    Type: Application
    Filed: July 23, 2003
    Publication date: January 27, 2005
    Inventors: David Nelson, Seshadri Jagannathan, Ramesh Jagannathan, Thomas Blanton, Sridhar Sadasivan, Byron Sever, David Tuschel
  • Publication number: 20040004715
    Abstract: An ion implanted semiconductor surface is illuminated with a flood illumination of monochromatic radiation, and an image of the surface is taken using light which has been Raman scattered. The illumination and imaging system are calibrated by flood illuminating a uniformly Raman scattering surface.
    Type: Application
    Filed: June 30, 2003
    Publication date: January 8, 2004
    Inventors: David Tuschel, Patrick J. Treado, Joseph E. Demuth