Patents by Inventor David Urner

David Urner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and method for measuring distance
    Patent number: 9030670
    Abstract: A method of tracking the position of an object, comprising using reference interference data from first output beam, reference interference data from a second output beam, measurement interference data from the first output beam, measurement interference data from the second output beam, and knowledge of the difference between the absolute phase offset of the first output beam and the absolute phase offset of the second output beam for both a reference interferometer (15?) and a measurement interferometer (15) to calculate a parameter indicative of the absolute phase offset of the measurement interferometer (15) for the first output beam. The calculated parameter is used to calculate the ratio of the optical path differences of the measurement interferometer (15) and the reference interferometer (15?).
    Type: Grant
    Filed: July 22, 2011
    Date of Patent: May 12, 2015
    Assignee: Isis Innovation Limited
    Inventors: Matthew Warden, David Urner
  • APPARATUS AND METHOD FOR MEASURING DISTANCE
    Publication number: 20130148129
    Abstract: A method of tracking the position of an object, comprising using reference interference data from first output beam, reference interference data from a second output beam, measurement interference data from the first output beam, measurement interference data from the second output beam, and knowledge of the difference between the absolute phase offset of the first output beam and the absolute phase offset of the second output beam for both a reference interferometer (15?) and a measurement interferometer (15) to calculate a parameter indicative of the absolute phase offset of the measurement interferometer (15) for the first output beam. The calculated parameter is used to calculate the ratio of the optical path differences of the measurement interferometer (15) and the reference interferometer (15?).
    Type: Application
    Filed: July 22, 2011
    Publication date: June 13, 2013
    Applicant: ISIS INNOVATION LIMITED
    Inventors: Matthew Warden, David Urner