Patents by Inventor David Vandervalk

David Vandervalk has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Programmable test instrument
    Patent number: 9759772
    Abstract: In general, a test instrument includes a first processing system that is programmable to run one or more test programs to test a device interfaced to the test instrument, and that is programmed to control operation of the test instrument, a second processing system that is dedicated to device testing, the second processing system being programmable to run one or more test programs to test the device, and programmable logic configured to act as an interface between the test instrument and the device, the programmable logic being configurable to perform one or more tests on the device. The first processing system and the second processing system are programmable to access the device via the programmable logic.
    Type: Grant
    Filed: October 28, 2011
    Date of Patent: September 12, 2017
    Assignee: Teradyne, Inc.
    Inventors: David Kaushansky, Lloyd K. Frick, Stephen J. Bourassa, David Vandervalk, Michael Thomas Fluet, Michael Francis McGoldrick
  • Managing interrupts
    Patent number: 8914566
    Abstract: A process for managing interrupts, which may be performed using electronic circuitry, includes: receiving interrupts bound for a processing device, where the interrupts are received from hardware devices that are configured to communicate with the processing device; generating data containing information corresponding to the interrupts; and sending the data to the processing device.
    Type: Grant
    Filed: June 19, 2012
    Date of Patent: December 16, 2014
    Assignee: Teradyne, Inc.
    Inventors: David Vandervalk, Lloyd K. Frick
  • MANAGING INTERRUPTS
    Publication number: 20130339803
    Abstract: A process for managing interrupts, which may be performed using electronic circuitry, includes: receiving interrupts bound for a processing device, where the interrupts are received from hardware devices that are configured to communicate with the processing device; generating data containing information corresponding to the interrupts; and sending the data to the processing device.
    Type: Application
    Filed: June 19, 2012
    Publication date: December 19, 2013
    Inventors: David Vandervalk, Lloyd K. Frick
  • PROGRAMMABLE TEST INSTRUMENT
    Publication number: 20130110445
    Abstract: In general, a test instrument includes a first processing system that is programmable to run one or more test programs to test a device interfaced to the test instrument, and that is programmed to control operation of the test instrument, a second processing system that is dedicated to device testing, the second processing system being programmable to run one or more test programs to test the device, and programmable logic configured to act as an interface between the test instrument and the device, the programmable logic being configurable to perform one or more tests on the device. The first processing system and the second processing system are programmable to access the device via the programmable logic.
    Type: Application
    Filed: October 28, 2011
    Publication date: May 2, 2013
    Applicant: TERADYNE, INC.
    Inventors: David Kaushansky, Lloyd K. Frick, Stephen J. Bourassa, David Vandervalk, Michael Thomas Fluet, Michael Francis McGoldrick