Abstract: A support holder for a test device is disclosed, wherein the holder may include a base having a first plurality of sidewalls having a first length and a second plurality of sidewalls having a second length, wherein the second length is greater than the first length, wherein the plurality of sidewalls define a cavity in the base, the cavity including a surface for receiving a portion of the test device; and a plurality of projections extending away from the base, wherein each projection of the plurality of projections is configured to be associated with a leg portion, and wherein a first sidewall of the first plurality of sidewalls includes a center notch positioned between a first corner portion and a second corner portion, and wherein a second sidewall of the first plurality of sidewalls includes a removable portion configured to cover an opening into an interior of the base.

Abstract: A support holder for a test device is disclosed, wherein the holder may include a base having a first plurality of sidewalls having a first length and a second plurality of sidewalls having a second length, wherein the second length is greater than the first length, wherein the plurality of sidewalls define a cavity in the base, the cavity including a surface for receiving a portion of the test device; and a plurality of projections extending away from the base, wherein each projection of the plurality of projections is configured to be associated with a leg portion, and wherein a first sidewall of the first plurality of sidewalls includes a center notch positioned between a first corner portion and a second corner portion, and wherein a second sidewall of the first plurality of sidewalls includes a removable portion configured to cover an opening into an interior of the base.

Abstract: A support holder for a test device is disclosed, wherein the holder may include a base having a first plurality of sidewalls having a first length and a second plurality of sidewalls having a second length, wherein the second length is greater than the first length, wherein the plurality of sidewalls define a cavity in the base, the cavity including a surface for receiving a portion of the test device; and a plurality of projections extending away from the base, wherein each projection of the plurality of projections is configured to be associated with a leg portion, and wherein a first sidewall of the first plurality of sidewalls includes a center notch positioned between a first corner portion and a second corner portion, and wherein a second sidewall of the first plurality of sidewalls includes a removable portion configured to cover an opening into an interior of the base.

Abstract: The present disclosure is directed to a streamlined sample preparation process, VERA (Viral Enrichment by Reducing Artifacts), to tilt total genomic material in favor of DNA/RNA viral genomes. This reduction of host genomic artifacts can be completed in <8 hours from sample acquisition. Using a rapid library preparation protocol (˜1.5 minutes) and real-time nanopore sequencing, potential viral contamination, for example RNA viral contamination, can be identified in less than one workday from sample acquisition.