Patents by Inventor David W. Bogardus

David W. Bogardus has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6542185
    Abstract: An image of an optical target including dark and light monochromatic patches is captured. An average YUV value is calculated from a predetermined number of YUV values for each monochromatic patch. A white balance is performed using the averaged YUV values and a predetermined reference image. Each averaged YUV value is converted to an equivalent RGB value. A difference in RGB values between the light and the dark monochromatic patches produces a dynamic range for the RGB values. The dynamic range for the G value is adjusted to match the dynamic range for a G′ value of the predetermined reference image.
    Type: Grant
    Filed: January 7, 1998
    Date of Patent: April 1, 2003
    Assignee: Intel Corporation
    Inventor: David W. Bogardus
  • Patent number: 5848237
    Abstract: A programmable digital filter. The digital filter detects a predefined pattern over a programmably variable duration. The filter includes an interval register which is coupled to receive an interval count. A sample register is coupled to receive a plurality of samples of an input signal which is sampled at an interval determined by the interval count. A plurality of pattern matching circuits generate a pattern match output if the plurality of samples matches one of a plurality of predetermined patterns, and a state logic circuit generates a signal if a new match is found. The pattern matching circuits may be stable high and stable low test circuits which cooperate to determine if all of the plurality of samples are of a consistent logic value.
    Type: Grant
    Filed: May 15, 1996
    Date of Patent: December 8, 1998
    Assignee: Intel Corporation
    Inventors: Leonard Cross, David W. Bogardus
  • Patent number: 4701696
    Abstract: A probe for a logic analyzer includes a replacement plug assembly comprising those portions of probe equipment which must be specifically adapted to accommodate a selected microprocessor, and a buffer probe assembly comprising those portions of probe equipment which are adapted for use with a wide variety of microprocessors. The replacement plug assembly and the buffer probe assembly are mechanically joined and electrically coupled by a square pin connector so that the replacement plug assembly may be removed from the probe and replaced with a differently configured replacement plug assembly when a different microprocessor is to be probed. Thus only a portion of the probe is changed to retarget the probe for different microprocessors.
    Type: Grant
    Filed: November 25, 1985
    Date of Patent: October 20, 1987
    Assignee: Tektronix, Inc.
    Inventors: David W. Bogardus, Robin L. Teitzel, David D. Chapman