Patents by Inventor David W. Chandler

David W. Chandler has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10770262
    Abstract: A scanning electron microscope (SEM) system includes an SEM objective that emits an electron beam toward a sample, causing emission of charged particles including secondary electrons, Auger electrons, backscattered electrons, anions and cations. The SEM system includes electron optics elements that are configured to establish electric fields around the sample that accelerate charged particles toward a detector. A two-dimensional distribution of locations of incidence of the charged particles on the detector is indicative of energies of the charged particles and their emission angles from the sample. A three-dimensional spatial distribution of charged particles emitted from the sample is recovered by performing an Abel transform over the distribution on the detector. The energies and emission angles of the charged particles are then determined from the three-dimensional spatial distribution.
    Type: Grant
    Filed: November 21, 2018
    Date of Patent: September 8, 2020
    Assignee: National Technology & Engineering Solutions of Sandia, LLC
    Inventors: David W. Chandler, Kimberlee Chiyoko Celio
  • Patent number: 8693004
    Abstract: In an embodiment, a dual-etalon cavity-ring-down frequency-comb spectrometer system is described. A broad band light source is split into two beams. One beam travels through a first etalon and a sample under test, while the other beam travels through a second etalon, and the two beams are recombined onto a single detector. If the free spectral ranges (“FSR”) of the two etalons are not identical, the interference pattern at the detector will consist of a series of beat frequencies. By monitoring these beat frequencies, optical frequencies where light is absorbed may be determined.
    Type: Grant
    Filed: March 17, 2011
    Date of Patent: April 8, 2014
    Assignee: Sandia Corporation
    Inventors: David W. Chandler, Kevin E. Strecker
  • Publication number: 20120002212
    Abstract: In an embodiment, a dual-etalon cavity-ring-down frequency-comb spectrometer system is described. A broad band light source is split into two beams. One beam travels through a first etalon and a sample under test, while the other beam travels through a second etalon, and the two beams are recombined onto a single detector. If the free spectral ranges (“FSR”) of the two etalons are not identical, the interference pattern at the detector will consist of a series of beat frequencies. By monitoring these beat frequencies, optical frequencies where light is absorbed may be determined.
    Type: Application
    Filed: March 17, 2011
    Publication date: January 5, 2012
    Inventors: David W. Chandler, Kevin E. Strecker
  • Patent number: 7310142
    Abstract: Photons emitted from a sample responsive to being excited by laser pulses are directed through a prism onto a photomultiplier tube having several spaced-apart anodes. The prism alters the path of each photon as a function of its wavelength so that the wavelength determines the anode to which the photon is directed. Taps of first and second delay lines that are coupled to respective alternating anodes. When an anode receives the photon, it generates a pulse that propagates through the delay line in opposite directions from its associated tap. A timer determines first and second times from the laser pulse to the pulse reaching the first and second ends of the delay line. The difference between the first and second times corresponds to the wavelength of the emitted photon and the sum of the first and second times corresponds to the emission delay of the emitted photon.
    Type: Grant
    Filed: August 22, 2005
    Date of Patent: December 18, 2007
    Assignee: Sandia National Laboratories
    Inventors: Carl C. Hayden, David W. Chandler, A. Khai Luong