Patents by Inventor David W. Long

David W. Long has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11933453
    Abstract: A system includes at least one article of personal protective equipment, one or more industrial devices, an industrial controller device configured to output industrial controller data indicative of one or more attributes of the one or more industrial devices, and a computing device. The computing devices is configured to determine a set of one or more safety rules corresponding to a work environment at the first time and determine a change in an attribute of the one or more attributes of the one or more industrial devices. The computing device is further configured to identify an updated set of one or more worker safety rules corresponding to the work environment at the second time and determine whether the status of at least one article of personal protective equipment satisfies the updated set of one or more worker safety rules.
    Type: Grant
    Filed: September 19, 2019
    Date of Patent: March 19, 2024
    Assignee: 3M Innovative Properties Company
    Inventors: Brian J. Swift, Andrew W. Long, David R. Stein
  • Patent number: 7610815
    Abstract: A method of monitoring the surface of a sample under test is provided and the method comprises the steps of: illuminating the surface with light (20) polarised in a first direction; viewing light reflected from the surface through a polarising filter (27) arranged at 90° to the first direction, wherein the surface of the sample under test is provided with a marked area where diffuse reflection of the incident polarised light will occur in order to improve the contrast between the marked area and the surface of the sample under text.
    Type: Grant
    Filed: April 24, 2006
    Date of Patent: November 3, 2009
    Assignee: Instron Limited
    Inventors: Paul D. Hayford, David W. Long
  • Patent number: 7047819
    Abstract: Test apparatus comprising means for holding a sample to be tested, means for altering the strain in the sample, an optical arrangement for monitoring the sample to be tested, and processing means for processing the signals resulting from the monitoring of the sample under test, wherein the environment between the optical arrangement and the sample under test is controlled, and wherein the sample to be tested is located in a position external to the controlled environment.
    Type: Grant
    Filed: October 10, 2003
    Date of Patent: May 23, 2006
    Assignee: Instron Limited
    Inventors: Paul D. Hayford, David W. Long
  • Publication number: 20040145724
    Abstract: Test apparatus comprising means for holding a sample to be tested, means for altering the strain in the sample, an optical arrangement for monitoring the sample to be tested, and processing means for processing the signals resulting from the monitoring of the sample under test, wherein the environment between the optical arrangement and the sample under test is controlled, and wherein the sample to be tested is located in a position external to the controlled environment.
    Type: Application
    Filed: October 10, 2003
    Publication date: July 29, 2004
    Inventors: Paul D. Hayford, David W. Long
  • Patent number: 5283596
    Abstract: A gray scale binary field corresponding to each of the pixels on a raster scan oscilloscope display. Each gray scale binary field has a portion of its bits assigned to correspond to the graphical information and a portion of its bits assigned to correspond to the sampled current and prior waveforms. A decrementing state machine, in a predetermined cycle of operation, periodically reads all of the gray scale binary fields in the display memory of the oscilloscope, decrements each value by a predetermined amount such as the binary value of one, and re-writes the decremented binary values back into the display memory. As these decremented gray scale binary fields are displayed, the older waveforms become uniformly more faded with the oldest waveform having the dimmest illumination. In a typical mode of operation, the predetermined cycle of operation corresponds to the sampling of each new waveform from the system under test so that each subsequent prior waveform is decremented by the predetermined amount.
    Type: Grant
    Filed: May 29, 1992
    Date of Patent: February 1, 1994
    Assignee: Hewlett-Packard Company
    Inventor: David W. Long
  • Patent number: 5254983
    Abstract: A gray scale binary field corresponding to each of the pixels on a raster scan oscilloscope display. Each gray scale binary field has a portion of its bits assigned to correspond to the graphical information and a portion of its bits assigned to correspond to the sampled current and prior waveforms. A decrementing state machine, in a predetermined cycle of operation, periodically reads all of the gray scale binary fields in the display memory of the oscilloscope, decrements each value by a predetermined amount such as the binary value of one, and re-writes the decremented binary values back into the display memory. As these decremented gray scale binary fields are displayed, the older waveforms become uniformly more faded with the oldest waveform having the dimmest illumination. In a typical mode of operation, the predetermined cycle of operation corresponds to the sampling of each new waveform from the system under test so that each subsequent prior waveform is decremented by the predetermined amount.
    Type: Grant
    Filed: February 5, 1991
    Date of Patent: October 19, 1993
    Assignee: Hewlett-Packard Company
    Inventors: David W. Long, Dennis J. Weller