Patents by Inventor David William John PANKRATZ

David William John PANKRATZ has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240112392
    Abstract: Devices and methods for node traversal for ray tracing are provided, which comprise casting a first ray in a space comprising objects represented by geometric shapes, traversing, for the first ray, at least one first node of an accelerated hierarchy structure representing an approximate volume of a group of the geometric shapes and a second node representing a volume of one of the geometric shapes, casting a second ray in the space, selecting, for the second ray, a starting node of traversal based on locations of intersection of the first ray and the second ray and an identifier which identifies one or more nodes intersected by the first ray and traversing, for the second ray, the accelerated hierarchy structure beginning at the starting node of traversal.
    Type: Application
    Filed: September 29, 2022
    Publication date: April 4, 2024
    Applicants: Advanced Micro Devices, Inc., ATI Technologies ULC
    Inventors: David William John Pankratz, Konstantin I. Shkurko
  • Patent number: 11908065
    Abstract: A technique for performing ray tracing operations is provided. The technique includes, in response to detecting that a threshold number of traversal stage work-items of a wavefront have terminated, increasing intersection test parallelization for non-terminated work-items.
    Type: Grant
    Filed: June 20, 2022
    Date of Patent: February 20, 2024
    Assignees: Advanced Micro Devices, Inc., ATI Technologies ULC
    Inventors: Daniel James Skinner, Michael John Livesley, David William John Pankratz
  • Patent number: 11783528
    Abstract: There is provided a method and apparatus for supporting an image rendering using ray tracing. For at least some elements (e.g. pixels), ray tracing results for previously evaluated elements are used to predict ray tracing results for the current element. These previously evaluated elements can be elements which are proximate to the current element. Feasibility testing and prediction can be performed to determine whether a prediction can be made, and the ray hit test and the opaqueness testing can determine whether the prediction is valid. If testing fails, a full ray tracing operation can be performed for the current element. The operations can be implemented using multithreading. Ray tracing patterning and resolution of elements used for prediction purposes can be adjusted based on prior performance.
    Type: Grant
    Filed: December 21, 2021
    Date of Patent: October 10, 2023
    Assignee: HUAWEI TECHNOLOGIES CO., LTD.
    Inventors: Tyler Bryce Nowicki, David William John Pankratz
  • Publication number: 20230298256
    Abstract: A technique for performing ray tracing operations is provided. The technique includes, in response to detecting that a threshold number of traversal stage work-items of a wavefront have terminated, increasing intersection test parallelization for non-terminated work-items.
    Type: Application
    Filed: June 20, 2022
    Publication date: September 21, 2023
    Applicants: Advanced Micro Devices, Inc., ATI Technologies ULC
    Inventors: Daniel James Skinner, Michael John Livesley, David William John Pankratz
  • Publication number: 20230196654
    Abstract: There is provided a method and apparatus for supporting an image rendering using ray tracing. For at least some elements (e.g. pixels), ray tracing results for previously evaluated elements are used to predict ray tracing results for the current element. These previously evaluated elements can be elements which are proximate to the current element. Feasibility testing and prediction can be performed to determine whether a prediction can be made, and the ray hit test and the opaqueness testing can determine whether the prediction is valid. If testing fails, a full ray tracing operation can be performed for the current element. The operations can be implemented using multithreading. Ray tracing patterning and resolution of elements used for prediction purposes can be adjusted based on prior performance.
    Type: Application
    Filed: December 21, 2021
    Publication date: June 22, 2023
    Applicant: HUAWEI TECHNOLOGIES CO., LTD.
    Inventors: Tyler Bryce NOWICKI, David William John PANKRATZ