Patents by Inventor David William Rank

David William Rank has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6434844
    Abstract: A see-thru engineering instrument has markings defining sets of longitudinal reference lines along its length. The reference lines are disposed inwardly of the side edges, and define segmentation patterns distinct to each set, distinguishing lines of the respective sets from each other. Lines of respective sets are preferably interposed each between respective lines of ones of another set or sets. Line segments in a single instrument, of the like illustrated, can define discrete measurable distances of any one, up to all, of {fraction (1/16)}, ⅛, {fraction (3/16)}, ¼, ½, ¾, {fraction (13/16)}, ⅞ and {fraction (15/16)} inch. The back surface of the instrument preferably has a matte finish. The width of the instrument is greater than 3 inches, preferably about 4 inches. The length is greater than 12 inches, preferably about 13 inches. The thickness is preferably about {fraction (1/16)} inch. The length/width ratio is at least {fraction (2/1)}.
    Type: Grant
    Filed: November 6, 2000
    Date of Patent: August 20, 2002
    Inventor: David William Rank
  • Patent number: 6357130
    Abstract: A drafting template for preparing axonometric drawings or sketches comprising a unitary, clear, substantially planar, chevron-shaped body having an apex and an antapex, an upper face, a lower face, and at least six side edges. Various embodiments of the template provide for preparing trimetric, dimetric and isometric drawings or sketches. The template is provided with indicia on an upper or lower face thereof for measuring and scaling the drawing.
    Type: Grant
    Filed: May 10, 1999
    Date of Patent: March 19, 2002
    Inventor: David William Rank
  • Patent number: 6158135
    Abstract: A see-thru engineering instrument has markings defining sets of longitudinal reference lines along its length. The reference lines are disposed inwardly of the side edges, and define segmentation patterns distinct to each set, distinguishing lines of the respective sets from each other. Lines of respective sets are preferably interposed each between respective lines of ones of another set or sets. Line segments in a single instrument, of the like illustrated, can define discrete measurable distances of any one, up to all, of 1/16, 1/8, 3/16, 1/4, 1/2, 3/4, 13/16, 7/8 and 15/16 inch. The back surface of the instrument preferably has a matte finish. The width of the instrument is greater than 3 inches, preferably about 4 inches. The length is greater than 12 inches, preferably about 13 inches. The thickness is preferably about 1/16 inch. The length/width ratio is at least 2/1. The markings on the instrument can include a grid of squares, marked over less than 2/3 of the overall area.
    Type: Grant
    Filed: April 10, 1998
    Date of Patent: December 12, 2000
    Inventor: David William Rank