Patents by Inventor David William Rook

David William Rook has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Optical thread profiler
    Patent number: 10036629
    Abstract: An apparatus configured to measure at least one physical characteristic of a threaded surface (e.g., an internally threaded surface) of an object is provided. The apparatus uses optical triangulation to perform non-contact characterization of the threaded surface. The apparatus can be used to characterize various aspects of the threaded surface, including generating the measurements required to produce a longitudinal cross-sectional profile of the threaded surface.
    Type: Grant
    Filed: March 22, 2017
    Date of Patent: July 31, 2018
    Assignee: Quest Metrology, LLC
    Inventors: Phillip Dewayne Bondurant, David William Rook, David H. Bothell, Christian Robert Lentz, David Jack Savage
  • OPTICAL THREAD PROFILER
    Publication number: 20170191824
    Abstract: An apparatus configured to measure at least one physical characteristic of a threaded surface (e.g., an internally threaded surface) of an object is provided. The apparatus uses optical triangulation to perform non-contact characterization of the threaded surface. The apparatus can be used to characterize various aspects of the threaded surface, including generating the measurements required to produce a longitudinal cross-sectional profile of the threaded surface.
    Type: Application
    Filed: March 22, 2017
    Publication date: July 6, 2017
    Applicant: Quest Metrology, LLC
    Inventors: Phillip Dewayne Bondurant, David William Rook, David H. Bothell, Christian Robert Lentz, David Jack Savage
  • Optical thread profiler
    Patent number: 9638517
    Abstract: An apparatus configured to measure at least one physical characteristic of a threaded surface (e.g., an internally threaded surface) of an object is provided. The apparatus uses optical triangulation to perform non-contact characterization of the threaded surface. The apparatus can be used to characterize various aspects of the threaded surface, including generating the measurements required to produce a longitudinal cross-sectional profile of the threaded surface.
    Type: Grant
    Filed: December 8, 2015
    Date of Patent: May 2, 2017
    Assignee: Quest Metrology, LLC
    Inventors: Phillip Dewayne Bondurant, David William Rook, David H. Bothell, Christian Robert Lentz, David Jack Savage
  • OPTICAL THREAD PROFILER
    Publication number: 20160091303
    Abstract: An apparatus configured to measure at least one physical characteristic of a threaded surface (e.g., an internally threaded surface) of an object is provided. The apparatus uses optical triangulation to perform non-contact characterization of the threaded surface. The apparatus can be used to characterize various aspects of the threaded surface, including generating the measurements required to produce a longitudinal cross-sectional profile of the threaded surface.
    Type: Application
    Filed: December 8, 2015
    Publication date: March 31, 2016
    Inventors: Phillip Dewayne Bondurant, David William Rook, David H. Bothell, Christian Robert Lentz, David Jack Savage
  • Optical thread profiler
    Patent number: 9234748
    Abstract: An apparatus configured to measure at least one physical characteristic of an threaded surface (e.g., an internally threaded surface) of an object is provided. The apparatus uses optical triangulation to perform non-contact characterization of the threaded surface. The apparatus can be used to characterize various aspects of the threaded surface, including generating the measurements required to produce a longitudinal cross-sectional profile of the threaded surface.
    Type: Grant
    Filed: August 29, 2014
    Date of Patent: January 12, 2016
    Assignee: Quest Metrology, LLC
    Inventors: Phillip Dewayne Bondurant, David William Rook, David H. Bothell, Christian Robert Lentz, David Jack Savage
  • Optical Thread Profiler
    Publication number: 20140368834
    Abstract: An apparatus configured to measure at least one physical characteristic of an threaded surface (e.g., an internally threaded surface) of an object is provided. The apparatus uses optical triangulation to perform non-contact characterization of the threaded surface. The apparatus can be used to characterize various aspects of the threaded surface, including generating the measurements required to produce a longitudinal cross-sectional profile of the threaded surface.
    Type: Application
    Filed: August 29, 2014
    Publication date: December 18, 2014
    Inventors: Phillip Dewayne Bondurant, David William Rook, David H. Bothell, Christian Robert Lentz, David Jack Savage
  • Optical thread profiler
    Patent number: 8860952
    Abstract: An apparatus configured to measure at least one physical characteristic of a threaded surface (e.g., an internally threaded surface) of an object is provided. The apparatus uses optical triangulation to perform non-contact characterization of the threaded surface. The apparatus can be used to characterize various aspects of the threaded surface, including generating the measurements required to produce a longitudinal cross-sectional profile of the threaded surface.
    Type: Grant
    Filed: June 11, 2012
    Date of Patent: October 14, 2014
    Assignee: Quest Metrology, LLC
    Inventors: Phillip Dewayne Bondurant, David William Rook, David H. Bothell, Christian Robert Lentz, David Jack Savage
  • OPTICAL THREAD PROFILER
    Publication number: 20120314223
    Abstract: An apparatus configured to measure at least one physical characteristic of an threaded surface (e.g., an internally threaded surface) of an object is provided. The apparatus uses optical triangulation to perform non-contact characterization of the threaded surface. The apparatus can be used to characterize various aspects of the threaded surface, including generating the measurements required to produce a longitudinal cross-sectional profile of the threaded surface.
    Type: Application
    Filed: June 11, 2012
    Publication date: December 13, 2012
    Applicant: Quest Metrology, LLC
    Inventors: Phillip Dewayne Bondurant, David William Rook, David H. Bothell, Christian Robert Lentz, David Jack Savage