Patents by Inventor David Winslow Randall

David Winslow Randall has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Inspection system setup techniques
    Patent number: 7072786
    Abstract: Techniques for efficiently setting up inspection, metrology, and review systems for operating upon semiconductor wafers are described. Specifically, this involves setting up recipes that allows each system to accurately inspect semiconductor wafers. The invention gathers pertinent information from these tools and presents the information to users in a way that greatly reduces the time required to complete a recipe. One system embodiment includes an inspection system and a review station that is communicatively linked such that the review station can read from and write to an entire set of data stored at the inspection system. The set of data includes image files of features detected by the inspection system.
    Type: Grant
    Filed: September 28, 2005
    Date of Patent: July 4, 2006
    Assignee: KLA-Tencor Technologies, Corporation
    Inventors: David Bruce Coldren, Prashant A. Aji, David Winslow Randall, Sharon Marie McCauley
  • Inspection system setup techniques
    Patent number: 6959251
    Abstract: Techniques for efficiently setting up inspection, metrology, and review systems for operating upon semiconductor wafers are described. Specifically, this involves setting up recipes that allows each system to accurately inspect semiconductor wafers. The invention gathers pertinent information from these tools and presents the information to users in a way that greatly reduces the time required to complete a recipe. One system embodiment includes an inspection system and a review station that is communicatively linked such that the review station can read from and write to an entire set of data stored at the inspection system. The set of data includes image files of features detected by the inspection system.
    Type: Grant
    Filed: November 14, 2002
    Date of Patent: October 25, 2005
    Assignee: KLA-Tencor Technologies, Corporation
    Inventors: David Bruce Coldren, Prashant A. Aji, David Winslow Randall, Sharon Marie McCauley
  • Inspection system setup techniques
    Publication number: 20040038454
    Abstract: Techniques for efficiently setting up inspection, metrology, and review systems for operating upon semiconductor wafers are described. Specifically, this involves setting up recipes that allows each system to accurately inspect semiconductor wafers. The invention gathers pertinent information from these tools and presents the information to users in a way that greatly reduces the time required to complete a recipe. One system embodiment includes an inspection system and a review station that is communicatively linked such that the review station can read from and write to an entire set of data stored at the inspection system. The set of data includes image files of features detected by the inspection system.
    Type: Application
    Filed: November 14, 2002
    Publication date: February 26, 2004
    Applicant: KLA-Tencor Technologies Corporation
    Inventors: David Bruce Coldren, Prashant A. Aji, David Winslow Randall, Sharon Marie McCauley