Abstract: A current sensor integrated circuit (IC) package includes an insulation structure disposed between a semiconductor die and a lead frame to control gap height and prevent the die from tilting and dropping the magnetic field coupling between the die the primary conductor. An insulation structure is disposed between the die and the lead frame such that the die remains level and magnetic coupling remains intact. An insulation structure may control the gap height between the lead frame and the die evenly during transfer molding, by supporting the die across its length and/or width. Epoxy dots are also or instead used to control the gap height and eliminate die tilt.

Abstract: A current sensor integrated circuit (IC) package is flip-chip bonded using a conductive film to connect the IC circuit bond pads to the lead frame. A conductive film is positioned between the die surface of a semiconductor die and at least one signal lead of the lead frame. The conductive film is conductive in a first direction between the die and the signal lead and nonconductive in other directions. The conductive film is further configured to control a gap height between the die and the lead frame to reduce die tilt, thus improving the sensitivity and performance consistency of the package.

Abstract: A current sensor integrated circuit (IC) package includes an insulation structure disposed between a semiconductor die and a lead frame to control gap height and prevent the die from tilting and dropping the magnetic field coupling between the die the primary conductor. An insulation structure is disposed between the die and the lead frame such that the die remains level and magnetic coupling remains intact. An insulation structure may control the gap height between the lead frame and the die evenly during transfer molding, by supporting the die across its length and/or width. Epoxy dots are also or instead used to control the gap height and eliminate die tilt.