Abstract: An apparatus comprises a toggle member, a plurality of pogo pins, and a test board in operable communication with the toggle member. The pogo pins are coupled to the toggle member to move along a first axis when the toggle member moves along the first axis. Each pogo pin includes a plunger that moves within the pogo pin along the first axis. The pogo pins and respective plungers contact a top surface of the DUT when the DUT is coupled to the test board and positioned so that a conductor on its outer surface is aligns to and contacts a conductive region of the test board. Movement of the toggle member along the first axis translates to the plungers, applying a pressure sufficient to the top surface of the DUT to ensure flushmount electrical contact between the conductor of the DUT and the conductive region.

Abstract: An apparatus comprises a toggle member, a plurality of pogo pins, and a test board in operable communication with the toggle member. The pogo pins are coupled to the toggle member to move along a first axis when the toggle member moves along the first axis. Each pogo pin includes a plunger that moves within the pogo pin along the first axis. The pogo pins and respective plungers contact a top surface of the DUT when the DUT is coupled to the test board and positioned so that a conductor on its outer surface is aligns to and contacts a conductive region of the test board. Movement of the toggle member along the first axis translates to the plungers, applying a pressure sufficient to the top surface of the DUT to ensure flushmount electrical contact between the conductor of the DUT and the conductive region.