Patents by Inventor Davide Palumbo

Davide Palumbo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10444173
    Abstract: A thermographic non-destructive inspection method of a structure, comprising the steps of: generating a modulated thermal wave in the direction of the structure; generating a temperature signal identifying a phase shift between the modulated thermal wave and a return thermal wave emitted from the structure; processing the temperature signal to obtain a first sub-signal related to the phase of the first harmonic of the temperature signal; identifying a first dimension of said defect as a function of the phase of the first harmonic of the temperature signal; calculating a first and a second intermediate parameter by calculating the difference between the phase value inside the zone with a defect and the phase value, absolute or mean of a plurality of points, of the undamaged zone close to the defect; and identifying a second dimension of the defect as a function of the first dimension and of the intermediate parameters.
    Type: Grant
    Filed: July 21, 2016
    Date of Patent: October 15, 2019
    Inventors: Giacomo Maione, Ciro Incarnato, Antonio Ciliberto, Umberto Galietti, Davide Palumbo, Gianpiero Cerrone
  • Publication number: 20170023505
    Abstract: A thermographic non-destructive inspection method of a structure, comprising the steps of: generating a modulated thermal wave in the direction of the structure; generating a temperature signal identifying a phase shift between the modulated thermal wave and a return thermal wave emitted from the structure; processing the temperature signal to obtain a first sub-signal related to the phase of the first harmonic of the temperature signal; identifying a first dimension of said defect as a function of the phase of the first harmonic of the temperature signal; calculating a first and a second intermediate parameter, ??1 for the first harmonic and ??2 for the third harmonic of the temperature signal, by calculating the difference, in degrees, between the phase value inside the zone with a defect and the phase value, absolute or mean of a plurality of points, of the undamaged zone close to the defect; and identifying a second dimension of the defect as a function of the first dimension and of the intermediate param
    Type: Application
    Filed: July 21, 2016
    Publication date: January 26, 2017
    Inventors: Giacomo Maione, Ciro Incarnato, Antonio Ciliberto, Umberto Galietti, Davide Palumbo, Gianpiero Cerrone