Abstract: A system operates solid-state storage memory. The system determines that a portion of the solid-state storage memory is of a type that has a failure mode of threshold voltage shift over time from successive reads at time intervals. The system alters or turns off a background process that performs such successive reads to check for memory reliability, for at least the portion of the solid-state storage memory. Or, the system uses the portion of solid-state storage memory for data bits, not parity bits.