Patents by Inventor Dawn A. Bonnell
Dawn A. Bonnell has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8918152Abstract: Disclosed are devices comprising multiple nanogaps having a separation of less than about 5 nm. Also disclosed are methods for fabricating these devices.Type: GrantFiled: February 13, 2008Date of Patent: December 23, 2014Assignee: The Trustees Of The University Of PennsylvaniaInventors: Douglas R. Strachan, Danvers E. Johnston, Beth S. Guiton, Peter K. Davies, Dawn A. Bonnell, Alan T. Johnson, Jr.
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Publication number: 20120280209Abstract: An electro-optical device includes a substrate on which first and second electrodes are formed. A plurality of nanoparticles are arrayed on the surface of the substrate between the first and second electrodes. The arrayed nanoparticles exhibit plasmonic activity in at least one wavelength band. A plurality of linking molecules are coupled between respective adjacent ones of the nanoparticles and between each of the electrodes and nanoparticles that are adjacent to the electrodes. The linking molecules are selected to exhibit photo-activity that is complementary to the arrayed nanoparticles.Type: ApplicationFiled: October 25, 2010Publication date: November 8, 2012Applicant: The Trustees of the University of PennsylvaniaInventors: Dawn Bonnell, Parag Banerjee, David Conklin, Sanjini Nanayakkara
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Publication number: 20100144535Abstract: Disclosed are devices comprising multiple nanogaps having a separation of less than about 5 nm. Also disclosed are methods for fabricating these devices.Type: ApplicationFiled: February 13, 2008Publication date: June 10, 2010Applicant: The Trustees of the University of PennsylvaniaInventors: Douglas R. Strachan, Danvers E. Johnston, Beth S. Guiton, Peter K. Davies, Dawn A. Bonnell, Alan T. Johnson, JR.
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Patent number: 7586166Abstract: Disclosed are electronic, plasmonic and opto-electronic components that are prepared using patterned photodeposited nanoparticles on a substrate surface. Also disclosed are ferroelectric nanolithography methods for preparing components, circuits and devices.Type: GrantFiled: April 18, 2006Date of Patent: September 8, 2009Assignee: The Trustees of the University of PennsylvaniaInventors: Dawn A. Bonnell, Xiaojun Joseph Lei, David Conklin
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Publication number: 20060189004Abstract: Disclosed are electronic, plasmonic and opto-electronic components that are prepared using patterned photodeposited nanoparticles on a substrate surface. Also disclosed are ferroelectric nanolithography methods for preparing components, circuits and devices.Type: ApplicationFiled: April 18, 2006Publication date: August 24, 2006Applicant: The Trustees of the University of PennsylvaniaInventors: Dawn Bonnell, Xiaojun Lei, David Conklin
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Patent number: 7093509Abstract: Scanning probe techniques based on the measurement of impedance spectroscopy using a conductive an SPM tip is provided and applied to the study of local transport properties, especially at a grain boundary. The contributions of the grain boundaries and tip-surface interaction can be distinguished based on the analysis of the equivalent circuit. The technique is applicable for both the spatially resolved study of transport mechanisms of polycrystalline semiconductors and the tip-surface contact quality. A piezoresponse force microscopy technique yields quantitative information about local non-linear dielectric properties and higher order electromechanical coupled of ferroelectrics.Type: GrantFiled: March 18, 2005Date of Patent: August 22, 2006Assignee: The Trustees of the University of PennsylvaniaInventors: Rui Shao, Sergei V. Kalinin, Dawn A. Bonnell
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Patent number: 7078896Abstract: A method for determining a magnetic force profile of a sample by using a cantilevered probe having a magnetic tip, the method comprising the steps of: traversing the tip along a predetermined path on the surface of the sample, the tip being proximate the surface of the sample while traversing along the predetermined path; determining the sample surface topography along the path; substantially canceling the sample surface potential along the path using the determined sample surface topography; and determining magnetic force data along the path based on the determined surface topography, wherein the determined magnetic force data is not magnetic force gradient data and the determined magnetic force data includes substantially no components from the sample surface potential.Type: GrantFiled: March 4, 2005Date of Patent: July 18, 2006Assignee: The Trustees Of The University of PennsylvaniaInventors: Dawn A. Bonnell, Sergei V. Kalinin, Rodolfo Antonio Alvarez
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Patent number: 7060510Abstract: Disclosed are electronic, plasmonic and opto-electronic components that are prepared using patterned photodeposited nanoparticles on a substrate surface. Also disclosed are ferroelectric nanolithography methods for preparing components, circuits and devices.Type: GrantFiled: May 12, 2005Date of Patent: June 13, 2006Assignee: The Trustees of the University of PennsylvaniaInventors: Dawn A. Bonnell, Xiaojun Lei, David Joseph Conklin
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Patent number: 6982174Abstract: A ferroelectric substrate (10) is patterned using local electric fields from an apparatus (14) to produce nanometer sized domains with controlled surface charge (12), that allow site selective metalization (22) and subsequent reaction with functional molecules (18), resulting in nanometer-scale molecular devices.Type: GrantFiled: August 15, 2001Date of Patent: January 3, 2006Assignee: The Trustees of the University of PennsylvaniaInventors: Dawn A. Bonnell, Rodolfo Antonio Alvarez, Sergei V. Kalinin
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Publication number: 20050262930Abstract: Scanning probe techniques based on the measurement of impedance spectroscopy using a conductive an SPM tip is provided and applied to the study of local transport properties, especially at a grain boundary. The contributions of the grain boundaries and tip-surface interaction can be distinguished based on the analysis of the equivalent circuit. The technique is applicable for both the spatially resolved study of transport mechanisms of polycrystalline semiconductors and the tip-surface contact quality. A piezoresponse force microscopy technique yields quantitative information about local non-linear dielectric properties and higher order electromechanical coupled of ferroelectrics.Type: ApplicationFiled: March 18, 2005Publication date: December 1, 2005Inventors: Rui Shao, Sergei Kalinin, Dawn Bonnell
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Publication number: 20050250243Abstract: Disclosed are electronic, plasmonic and opto-electronic components that are prepared using patterned photodeposited nanoparticles on a substrate surface. Also disclosed are ferroelectric nanolithography methods for preparing components, circuits and devices.Type: ApplicationFiled: May 12, 2005Publication date: November 10, 2005Applicant: University of PennsylvaniaInventors: Dawn Bonnell, Xiaojun Lei, David Conklin
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Publication number: 20050174130Abstract: A scanning probe detects phase changes of a cantilevered tip proximate to a sample, the oscillations of the cantilevered tip are induced by a lateral bias applied to the sample to quantify the local impedance of the interface normal to the surface of the sample. An ac voltage having a frequency is applied to the sample. The sample is placed at a fixed distance from the cantilevered tip and a phase angle of the cantilevered tip is measured. The position of the cantilevered tip is changed relative to the sample and another phase angle is measured. A phase shift of the deflection of the cantilevered tip is determined based on the phase angles. The impedance of the grain boundary, specifically interface capacitance and resistance, is calculated based on the phase shift and the frequency of the ac voltage. Magnetic properties are measured by applying a dc bias to the tip that cancels electrostatic forces, thereby providing direct measurement of magnetic forces.Type: ApplicationFiled: March 4, 2005Publication date: August 11, 2005Applicant: Trustees of the University of PennsylvaniaInventors: Dawn Bonnell, Sergei Kalinin, Rodolfo Alvarez
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Patent number: 6873163Abstract: A scanning probe detects phase changes of a cantilevered tip proximate to a sample, the oscillations of the cantilevered tip are induced by a lateral bias applied to the sample to quantify the local impedance of the interface normal to the surface of the sample. An ac voltage having a frequency is applied to the sample. The sample is placed at a fixed distance from the cantilevered tip and a phase angle of the cantilevered tip is measured. The position of the cantilevered tip is changed relative to the sample and another phase angle is measured. A phase shift of the deflection of the cantilevered tip is determined based on the phase angles. The impedance of the grain boundary, specifically interface capacitance and resistance, is calculated based on the phase shift and the frequency of the ac voltage. Magnetic properties are measured by applying a dc bias to the tip that cancels electrostatic forces, thereby providing direct measurement of magnetic forces.Type: GrantFiled: January 18, 2002Date of Patent: March 29, 2005Assignee: The Trustees of the University of PennsylvaniaInventors: Dawn A. Bonnell, Sergei V. Kalinin, Rodolfo Antonio Alvarez
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Patent number: 6720553Abstract: The present invention is directed to a tip calibration standard for characterizing the geometric and electrostatic properties of the probe tips of scanning probe microscopes comprising a carbon nanotube mounted on a dielectric surface of a grounded, conductive substrate and connected to a contact mounted on the substrate. The present invention is also directed to methods for using such a tip calibration standard in calibrating probe tips, computing tip geometry and electrostatic data, and determining the convolution function so that tip-surface interaction effects can be separated from scanning probe microscope surface image data.Type: GrantFiled: January 17, 2003Date of Patent: April 13, 2004Assignee: Trustees of the University of PennsylvaniaInventors: Dawn Bonnell, Alan T. Johnson, Sergei V. Kalinin, Marcus Freitag
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Publication number: 20040029297Abstract: A ferroelectric substrate (10) is patterned using local electric fields from an apparatus (14) to produce nanometer sized domains with controlled surface charge (12), that allow site selective metalization (22) and subsequent reaction with functional molecules (18), resulting in nanometer-scale molecular devices.Type: ApplicationFiled: September 3, 2003Publication date: February 12, 2004Inventors: Dawn A. Bonnell, Rodolfo Antonio Alvarez, Sergei V. Kalinin
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Publication number: 20030132376Abstract: The present invention is directed to a tip calibration standard for characterizing the geometric and electrostatic properties of the probe tips of scanning probe microscopes comprising a carbon nanotube mounted on a dielectric surface of a grounded, conductive substrate and connected to a contact mounted on the substrate. The present invention is also directed to methods for using such a tip calibration standard in calibrating probe tips, computing tip geometry and electrostatic data, and determining the convolution function so that tip-surface interaction effects can be separated from scanning probe microscope surface image data.Type: ApplicationFiled: January 17, 2003Publication date: July 17, 2003Applicant: The Trustees of the University of PennsylvaniaInventors: Dawn Bonnell, Alan T. Johnson, Sergei V. Kalinin, Marcus Freitag
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Publication number: 20030067308Abstract: A scanning probe detects phase changes of a cantilevered tip proximate to a sample, the oscillations of the cantilevered tip are induced by a lateral bias applied to the sample to quantify the local impedance of the interface normal to the surface of the sample. An ac voltage having a frequency is applied to the sample. The sample is placed at a fixed distance from the cantilevered tip and a phase angle of the cantilevered tip is measured. The position of the cantilevered tip is changed relative to the sample and another phase angle is measured. A phase shift of the deflection of the cantilevered tip is determined based on the phase angles. The impedance of the grain boundary, specifically interface capacitance and resistance, is calculated based on the phase shift and the frequency of the ac voltage. Magnetic properties are measured by applying a dc bias to the tip that cancels electrostatic forces, thereby providing direct measurement of magnetic forces.Type: ApplicationFiled: January 18, 2002Publication date: April 10, 2003Inventors: Dawn A. Bonnell, Sergei V. Kalinin, Rodolfo Antonio Alvarez