Patents by Inventor Dawn Cutler

Dawn Cutler has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and arrangment for testing a stacked die semiconductor device
    Publication number: 20070051949
    Abstract: A semiconductor device and related testing methods and configurations are provided to enable parallel (simultaneous) testing of multiple chips on a stacked multiple chip semiconductor device. Each chip in the device is configured to selectively output test results to one or more unique contacts on a substrate of the device.
    Type: Application
    Filed: September 6, 2005
    Publication date: March 8, 2007
    Inventors: Peter Schneider, Dawn Cutler