Patents by Inventor DE-HUNG WANG

DE-HUNG WANG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11916131
    Abstract: According to an exemplary embodiment, a method of forming a vertical device is provided. The method includes: providing a protrusion over a substrate; forming an etch stop layer over the protrusion; laterally etching a sidewall of the etch stop layer; forming an insulating layer over the etch stop layer; forming a film layer over the insulating layer and the etch stop layer; performing chemical mechanical polishing on the film layer and exposing the etch stop layer; etching a portion of the etch stop layer to expose a top surface of the protrusion; forming an oxide layer over the protrusion and the film layer; and performing chemical mechanical polishing on the oxide layer and exposing the film layer.
    Type: Grant
    Filed: November 4, 2020
    Date of Patent: February 27, 2024
    Assignee: Taiwan Semiconductor Manufacturing Company Limited
    Inventors: De-Fang Chen, Teng-Chun Tsai, Cheng-Tung Lin, Li-Ting Wang, Chun-Hung Lee, Ming-Ching Chang, Huan-Just Lin
  • Patent number: 11916022
    Abstract: Various embodiments of the present disclosure are directed towards a semiconductor processing system including an overlay (OVL) shift measurement device. The OVL shift measurement device is configured to determine an OVL shift between a first wafer and a second wafer, where the second wafer overlies the first wafer. A photolithography device is configured to perform one or more photolithography processes on the second wafer. A controller is configured to perform an alignment process on the photolithography device according to the determined OVL shift. The photolithography device performs the one or more photolithography processes based on the OVL shift.
    Type: Grant
    Filed: June 7, 2022
    Date of Patent: February 27, 2024
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Yeong-Jyh Lin, Ching I Li, De-Yang Chiou, Sz-Fan Chen, Han-Jui Hu, Ching-Hung Wang, Ru-Liang Lee, Chung-Yi Yu
  • Patent number: 8477632
    Abstract: An antenna testing device for testing an antenna assembled in a portable wireless communication device includes a data processing unit configured to receive signals from a CPU of the portable wireless communication device, a feedback unit, and a duplexer. The data processing unit sends the signals to the antenna by the feedback unit and the duplexer. The feedback unit feeds back mixed feedback signals mixed with signals leaked from the antenna to the data processing unit. The data processing unit judges whether the antenna is working properly according to the mixed feedback signals.
    Type: Grant
    Filed: April 30, 2010
    Date of Patent: July 2, 2013
    Assignee: FIH (Hong Kong) Limited
    Inventors: Yuan-Hong Lo, Kuan-Chi Liao, De-Hung Wang, Yu-Ting Chen, Yi-Hsien Weng, Jhao-Yang Li
  • Publication number: 20110069617
    Abstract: An antenna testing device for testing an antenna assembled in a portable wireless communication device includes a data processing unit configured to receive signals from a CPU of the portable wireless communication device, a feedback unit, and a duplexer. The data processing unit sends the signals to the antenna by the feedback unit and the duplexer. The feedback unit feeds back mixed feedback signals mixed with signals leaked from the antenna to the data processing unit. The data processing unit judges whether the antenna is working properly according to the mixed feedback signals.
    Type: Application
    Filed: April 30, 2010
    Publication date: March 24, 2011
    Applicant: FOXCONN COMMUNICATION TECHNOLOGY CORP.
    Inventors: YUAN-HONG LO, KUAN-CHI LIAO, DE-HUNG WANG, YU-TING CHEN, YI-HSIEN WENG, JHAO-YANG LI