Abstract: The present disclosure includes apparatuses and methods for data compression and management. A number of methods include receiving a number of data segments corresponding to a managed unit amount of data, determining a respective compressibility of each of the number of data segments, compressing each of the number of data segments in accordance with its respective determined compressibility, forming a compressed managed unit that includes compressed and/or uncompressed data segments corresponding to the number of data segments corresponding to the managed unit amount of data, and forming a page of data that comprises at least the compressed managed unit.

Abstract: The present disclosure includes apparatuses and methods for data compression and management. A number of methods include receiving a number of data segments corresponding to a managed unit amount of data, determining a respective compressibility of each of the number of data segments, compressing each of the number of data segments in accordance with its respective determined compressibility, forming a compressed managed unit that includes compressed and/or uncompressed data segments corresponding to the number of data segments corresponding to the managed unit amount of data, and forming a page of data that comprises at least the compressed managed unit.

Abstract: The present disclosure includes apparatuses and methods for data compression and management. A number of methods include receiving a number of data segments corresponding to a managed unit amount of data, determining a respective compressibility of each of the number of data segments, compressing each of the number of data segments in accordance with its respective determined compressibility, forming a compressed managed unit that includes compressed and/or uncompressed data segments corresponding to the number of data segments corresponding to the managed unit amount of data, and forming a page of data that comprises at least the compressed managed unit.

Abstract: Examples of memory controllers are described that may repair a memory using a bus between the memory controller and the memory. The memory controllers may include a test mode engine able to place the memory into a test mode of operation using a combination of signals over the bus, which combination of signals may be illegal in normal operation. The memory system controllers may include a BIST engine for testing the memory and obtaining information regarding memory fail information. The test mode engines may be configured to adjust a clock frequency during the test mode of operation, including stopping a clock signal in some examples between test mode commands.

Abstract: The present disclosure includes apparatuses and methods for data compression and management. A number of methods include receiving a number of data segments corresponding to a managed unit amount of data, determining a respective compressibility of each of the number of data segments, compressing each of the number of data segments in accordance with its respective determined compressibility, forming a compressed managed unit that includes compressed and/or uncompressed data segments corresponding to the number of data segments corresponding to the managed unit amount of data, and forming a page of data that comprises at least the compressed managed unit.

Abstract: A method and system for testing a memory module that has at least a first and second memory bank. The first and second memory banks have a plurality of integrated circuit (IC) devices for storing data and the IC devices have a plurality of control lines coupled thereto. A first portion of the plurality of control lines are allocated to the IC devices of the first bank of the module. A second portion of the plurality of control lines are allocated to the IC devices of the second bank of the module. The IC devices of the first and second banks of the module are tested substantially simultaneously using the first and second portions of the plurality of control lines.

Abstract: A method and system for testing a memory module that has at least a first and second memory bank. The first and second memory banks have a plurality of integrated circuit (IC) devices for storing data and the IC devices have a plurality of control lines coupled thereto. A first portion of the plurality of control lines are allocated to the IC devices of the first bank of the module. A second portion of the plurality of control lines are allocated to the IC devices of the second bank of the module. The IC devices of the first and second banks of the module are tested substantially simultaneously using the first and second portions of the plurality of control lines.

Abstract: A method and system for testing a memory module that has at least a first and second memory bank. The first and second memory banks have a plurality of integrated circuit (IC) devices for storing data and the IC devices have a plurality of control lines coupled thereto. A first portion of the plurality of control lines are allocated to the IC devices of the first bank of the module. A second portion of the plurality of control lines are allocated to the IC devices of the second bank of the module. The IC devices of the first and second banks of the module are tested substantially simultaneously using the first and second portions of the plurality of control lines.