Patents by Inventor Debansu Chaudhuri

Debansu Chaudhuri has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Transmission microscopy using light emitted from nanoparticles
    Patent number: 7929132
    Abstract: Systems and methods for performing transmission microscopy on a sample material are disclosed. The sample material is placed on a metal nanoparticle substrate. High intensity light, such as an infrared laser, is focused on the nanoparticle substrate, thereby exciting the silver nanoparticles. The excited nanoparticles emit intensely focused, spectrally broad white light that is able to pass through the sample material without significant scattering even when the sample material is highly diffuse. The emitted light that passes through the sample material is detected and used to generate images and characterize features of the sample material, including the internal structural composition of the sample material.
    Type: Grant
    Filed: July 10, 2009
    Date of Patent: April 19, 2011
    Assignee: University of Utah Research Foundation
    Inventors: John Mark Lupton, Michael H. Bartl, Debansu Chaudhuri, Jeremy Galusha, Nicholas Borys, Manfred Josef Walter
  • TRANSMISSION MICROSCOPY USING LIGHT EMITTED FROM NANOPARTICLES
    Publication number: 20110007386
    Abstract: Systems and methods for performing transmission microscopy on a sample material are disclosed. The sample material is placed on a metal nanoparticle substrate. High intensity light, such as an infrared laser, is focused on the nanoparticle substrate, thereby exciting the silver nanoparticles. The excited nanoparticles emit intensely focused, spectrally broad white light that is able to pass through the sample material without significant scattering even when the sample material is highly diffuse. The emitted light that passes through the sample material is detected and used to generate images and characterize features of the sample material, including the internal structural composition of the sample material.
    Type: Application
    Filed: July 10, 2009
    Publication date: January 13, 2011
    Inventors: John Mark Lupton, Michael H. Bartl, Debansu Chaudhuri, Jeremy Galusha, Nicholas Borys, Manfred Josef Walter