Patents by Inventor Debraj Debashish Basu

Debraj Debashish Basu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230282018
    Abstract: The present disclosure relates to systems, methods, and non-transitory computer readable media that utilize intelligent contextual bias weights for informing keyphrase relevance models to extract keyphrases. For example, the disclosed systems generate a graph from a digital document by mapping words from the digital document to nodes of the graph. In addition, the disclosed systems determine named entity bias weights for the nodes of the graph utilizing frequencies with which the words corresponding to the nodes appear within named entities identified from the digital document. Moreover, the disclosed systems generate a keyphrase summary for the digital document utilizing the graph and a machine learning model biased according to the named entity bias weights for the nodes of the graph.
    Type: Application
    Filed: March 3, 2022
    Publication date: September 7, 2023
    Inventors: Debraj Debashish Basu, Shankar Venkitachalam, Vinh Khuc, Deepak Pai
  • Patent number: 11610085
    Abstract: In some examples, a prototype model that includes a representative subset of data points (e.g., inputs and output classifications) of a machine learning model is analyzed to efficiently interpret the machine learning model's behavior. Performance metrics such as a critic fraction, local explanation scores, and global explanation scores are determined. A local explanation score capture an importance of a feature of a test point to the machine learning model determining a particular class for the test point and is computed by comparing a value of a feature of a test point to values for prototypes of the prototype model. Using a similar approach, global explanation scores may be computed for features by combining local explanation scores for data points. A critic fraction may be computed to quantify a misclassification rate of the prototype model, indicating the interpretability of the model.
    Type: Grant
    Filed: February 28, 2019
    Date of Patent: March 21, 2023
    Assignee: ADOBE INC.
    Inventors: Deepak Pai, Debraj Debashish Basu, Joshua Alan Sweetkind-Singer
  • Publication number: 20220300557
    Abstract: Enhanced methods for improving the performance of classifiers are described. A ground-truth labeled dataset is accessed. A classifier predicts a predicted label for datapoints of the dataset. A confusion matrix for the dataset and classifier is generated. A credibility interval is determined for a performance metric for each label. A first labels with a sufficiently large credibility interval is identified. A second label is identified, where the classifier is likely to confuse, in its predictions, the first label with the second label. The identification of the second label is based on instances of incorrect label predictions of the classifier for the first and/or the second labels. The classifier is updated based on a new third label that includes an aggregation of the first label and the second label. The updated classifier model predicts the third label for any datapoint that the classifier previously predicted the first or second labels.
    Type: Application
    Filed: March 16, 2021
    Publication date: September 22, 2022
    Inventors: Debraj Debashish Basu, Ganesh Satish Mallya, Shankar Venkitachalam, Deepak Pai
  • Publication number: 20200279140
    Abstract: In some examples, a prototype model that includes a representative subset of data points (e.g., inputs and output classifications) of a machine learning model is analyzed to efficiently interpret the machine learning model's behavior. Performance metrics such as a critic fraction, local explanation scores, and global explanation scores are determined. A local explanation score capture an importance of a feature of a test point to the machine learning model determining a particular class for the test point and is computed by comparing a value of a feature of a test point to values for prototypes of the prototype model. Using a similar approach, global explanation scores may be computed for features by combining local explanation scores for data points. A critic fraction may be computed to quantify a misclassification rate of the prototype model, indicating the interpretability of the model.
    Type: Application
    Filed: February 28, 2019
    Publication date: September 3, 2020
    Inventors: Deepak Pai, Debraj Debashish Basu, Joshua Alan Sweetkind-Singer