Abstract: An electronic system, comprising a critical logic circuit, various scan chains, and a control circuit, is provided. The critical logic circuit includes a critical path. One or more scan chains of the electronic system are coupled to the critical logic circuit and are associated with sensitization of the critical path. The control circuit may receive one or more configuration datasets, where each configuration dataset includes a scan chain identifier and a test pattern. For each received configuration dataset, the control circuit may identify a scan chain, of the one or more scan chains, that is associated with the scan chain identifier, and load the identified scan chain with the test pattern. Some scan flip-flops of the loaded one or more scan chains are utilized to sensitize the critical path.