Patents by Inventor Deepak Baranwal

Deepak Baranwal has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11749367
    Abstract: In an embodiment, a method includes: receiving, with a first buffer of a first error compactor unit (ECU), a first error packet associated with a first circuit; receiving, with the first buffer, a second error packet associated with a second circuit; transmitting a first reading request for reading the first error packet; receiving the first reading request with an arbiter of an error aggregator unit (EAU) of a central error management circuit; in response to receiving the first reading request, reading the first error packet from the first buffer, transmitting the first error packet to a controller of the central error management circuit, and transmitting a first acknowledgement to the first ECU; receiving the first acknowledgement with the first ECU; and in response to receiving the first acknowledgement, transmitting a second reading request for reading the second error packet.
    Type: Grant
    Filed: January 3, 2022
    Date of Patent: September 5, 2023
    Assignee: STMICROELECTRONICS INTERNATIONAL N.V.
    Inventors: Vivek Mohan Sharma, Deepak Baranwal, Nicolas Bernard Grossier, Samiksha Agarwal
  • Publication number: 20220357973
    Abstract: A communication system couples a plurality of processing cores together, each having an associated register storing a virtual machine ID, which is inserted into requests sent by the respective processing core. A master circuit has associated a master interface circuit, wherein the master interface circuit has associated register for storing a second virtual machine ID, which is inserted into requests sent by the master circuit. A slave circuit has associated a slave interface circuit configured to selectively forward read or write requests addressed to an address sub-range. The slave interface circuit has associated a third register storing a third virtual machine ID associated with the address sub-range and is configured to receive a request addressed to the address sub-range, extract from the request a virtual machine ID, determine whether the extracted virtual machine ID corresponds to the third virtual machine ID, and then either forwards or rejects the request.
    Type: Application
    Filed: May 4, 2022
    Publication date: November 10, 2022
    Applicants: STMICROELECTRONICS APPLICATION GMBH, STMicroelectronics International N.V.
    Inventors: Boris VITTORELLI, Simrata BATRA, Vivek Kumar SOOD, Deepak BARANWAL
  • Publication number: 20220334862
    Abstract: Disclosed herein is hardware for easing the process of changing the execution mode of a virtual machine and its associated resources. By adopting the hardware, it is possible to trigger a change in the execution mode in an automatic way, without software intervention, and without interfering with the execution of other virtual machines. In addition, in case an error has occurred for a virtual machine and it is detected, the hardware can be used to disable the resources associated with that virtual machine and generate notification of the completion this operation to other hardware, which will complete the reset of the virtual machine. By adopting the hardware, the execution mode change is simplified and offers configurability and flexibility for a system running multiple virtual machines.
    Type: Application
    Filed: April 20, 2021
    Publication date: October 20, 2022
    Applicants: STMicroelectronics International N.V., STMicroelectronics Application GmbH
    Inventors: Deepak BARANWAL, Amritanshu ANAND, Roberto COLOMBO, Boris VITTORELLI
  • Patent number: 11397809
    Abstract: An embedded system includes a peripheral and system-on-a-chip executing virtual machines and a hypervisor. The peripheral includes a crossbar circuit receiving digital sensor signals and selectively outputting the digital sensor signals to different outputs, queue circuits each receiving a different one of the digital sensor signals from the crossbar circuit, and queue protection circuits associated with the queue circuits and selectively permitting access to one of the queue circuits by the virtual machines. The hypervisor controls the queue protection circuits to set which of the virtual machines may access which queue circuits. A sensor protection circuit selectively permits reading of the digital sensor signals from the crossbar circuit by the queue circuits. The hypervisor controls the sensor protection circuit to set which of the queue circuits may access each of the digital sensor signals from the crossbar circuit.
    Type: Grant
    Filed: September 23, 2019
    Date of Patent: July 26, 2022
    Assignee: STMicroelectronics International N.V.
    Inventors: Deepak Baranwal, Nirav Prashantkumar Trivedi, Sandip Atal
  • Patent number: 11360143
    Abstract: A testing tool includes a clock generation circuit generating a test clock and outputting the test clock via a test clock output pad, data processing circuitry clocked by the test clock, and data output circuitry receiving data output from the data processing circuitry and outputting the data via an input/output (IO) pad, the data output circuitry being clocked by the test clock. The testing tool also includes a programmable delay circuit generating a delayed version of the test clock, and data input circuitry receiving data input via the IO pad, the data input circuitry clocked by the delayed version of the test clock. The delayed version of the test clock is delayed to compensate for delay between transmission of a pulse of the test clock via the test clock output pad to an external computer and receipt of the data input from the external computer via the IO pad.
    Type: Grant
    Filed: October 29, 2020
    Date of Patent: June 14, 2022
    Assignees: STMicroelectronics International N.V., STMicroelectronics Application GmbH, STMicroelectronics S.r.l.
    Inventors: Avneep Kumar Goyal, Deepak Baranwal, Thomas Szurmant, Nicolas Bernard Grossier
  • Publication number: 20220137128
    Abstract: A testing tool includes a clock generation circuit generating a test clock and outputting the test clock via a test clock output pad, data processing circuitry clocked by the test clock, and data output circuitry receiving data output from the data processing circuitry and outputting the data via an input/output (IO) pad, the data output circuitry being clocked by the test clock. The testing tool also includes a programmable delay circuit generating a delayed version of the test clock, and data input circuitry receiving data input via the IO pad, the data input circuitry clocked by the delayed version of the test clock. The delayed version of the test clock is delayed to compensate for delay between transmission of a pulse of the test clock via the test clock output pad to an external computer and receipt of the data input from the external computer via the IO pad.
    Type: Application
    Filed: October 29, 2020
    Publication date: May 5, 2022
    Applicants: STMicroelectronics International N.V., STMicroelectronics Application GmbH, STMicroelectronics S.r.l.
    Inventors: Avneep Kumar GOYAL, Deepak BARANWAL, Thomas SZURMANT, Nicolas Bernard GROSSIER
  • Publication number: 20220122682
    Abstract: In an embodiment, a method includes: receiving, with a first buffer of a first error compactor unit (ECU), a first error packet associated with a first circuit; receiving, with the first buffer, a second error packet associated with a second circuit; transmitting a first reading request for reading the first error packet; receiving the first reading request with an arbiter of an error aggregator unit (EAU) of a central error management circuit; in response to receiving the first reading request, reading the first error packet from the first buffer, transmitting the first error packet to a controller of the central error management circuit, and transmitting a first acknowledgement to the first ECU; receiving the first acknowledgement with the first ECU; and in response to receiving the first acknowledgement, transmitting a second reading request for reading the second error packet.
    Type: Application
    Filed: January 3, 2022
    Publication date: April 21, 2022
    Inventors: Vivek Mohan Sharma, Deepak Baranwal, Nicolas Bernard Grossier, Samiksha Agarwal
  • Patent number: 11217323
    Abstract: In an embodiment, a method includes: receiving, with a first buffer of a first error compactor unit (ECU), a first memory error packet associated with a first memory; receiving, with the first buffer, a second memory error packet associated with a second memory; transmitting a first reading request for reading the first memory error packet; receiving the first reading request with an arbiter of an error aggregator unit (EAU) of a central memory error management unit (MEMU); in response to receiving the first reading request, reading the first memory error packet from the first buffer, transmitting the first memory error packet to a controller of the central MEMU, and transmitting a first acknowledgement to the first ECU; receiving the first acknowledgement with the first ECU; and in response to receiving the first acknowledgement, transmitting a second reading request for reading the second memory error packet.
    Type: Grant
    Filed: September 2, 2020
    Date of Patent: January 4, 2022
    Assignee: STMicroelectronics International N.V.
    Inventors: Vivek Mohan Sharma, Deepak Baranwal, Nicolas Bernard Grossier, Samiksha Agarwal
  • Patent number: 11209482
    Abstract: A device for a system on a chip (SOC), the device includes: a comparator that includes a first input port, a second input port, and an output port. A first input signal and a second input signal are split into N bit pairs that include one bit from the first input signal and one bit from the second input signal. The comparator is configured so a mismatch between the first input signal and the second input signal causes an output signal to assume a first expected state. The device further comprises a test controller to perform a first operability test by mismatching the N bit pairs and verifying that the output signal assumes the first expected state.
    Type: Grant
    Filed: November 30, 2020
    Date of Patent: December 28, 2021
    Assignee: STMICROELECTRONICS INTERNATIONAL N.V.
    Inventors: Vivek Mohan Sharma, Deepak Baranwal, Amulya Pandey
  • Publication number: 20210089651
    Abstract: An embedded system includes a peripheral and system-on-a-chip executing virtual machines and a hypervisor. The peripheral includes a crossbar circuit receiving digital sensor signals and selectively outputting the digital sensor signals to different outputs, queue circuits each receiving a different one of the digital sensor signals from the crossbar circuit, and queue protection circuits associated with the queue circuits and selectively permitting access to one of the queue circuits by the virtual machines. The hypervisor controls the queue protection circuits to set which of the virtual machines may access which queue circuits. A sensor protection circuit selectively permits reading of the digital sensor signals from the crossbar circuit by the queue circuits. The hypervisor controls the sensor protection circuit to set which of the queue circuits may access each of the digital sensor signals from the crossbar circuit.
    Type: Application
    Filed: September 23, 2019
    Publication date: March 25, 2021
    Applicant: STMicroelectronics International N.V.
    Inventors: Deepak BARANWAL, Nirav Prashantkumar TRIVEDI, Sandip ATAL
  • Patent number: 9558052
    Abstract: A safety system monitors faults in an embedded control system. The embedded control system is modeled to produce one or more model check values by calculating how many clock cycles will pass between an initialization time point and at least one event time point for a specific event. The initialization time point is a certain point in an initialization function of a scheduler in the embedded control system. The at least one event time point is an expected number of clock cycles to pass before a specific event occurs. In operation, the embedded control system is initialized, a current clock cycle counter value is retrieved at a certain point in the initialization, and either an occurrence or an absence of an occurrence of a scheduled event is recognized. A current clock cycle value is recorded upon the recognition, and a mathematic check value is produced from the clock cycle value stored at the certain point in the initialization and the clock cycle value recorded upon the recognition.
    Type: Grant
    Filed: March 18, 2014
    Date of Patent: January 31, 2017
    Assignees: STMicroelectronics International N.V., STMicroelectronics S.R.L.
    Inventors: Om Ranjan, Giampiero Borgonovo, Deepak Baranwal
  • Publication number: 20150268133
    Abstract: A safety system monitors faults in an embedded control system. The embedded control system is modeled to produce one or more model check values by calculating how many clock cycles will pass between an initialization time point and at least one event time point for a specific event. The initialization time point is a certain point in an initialization function of a scheduler in the embedded control system. The at least one event time point is an expected number of clock cycles to pass before a specific event occurs. In operation, the embedded control system is initialized, a current clock cycle counter value is retrieved at a certain point in the initialization, and either an occurrence or an absence of an occurrence of a scheduled event is recognized. A current clock cycle value is recorded upon the recognition, and a mathematic check value is produced from the clock cycle value stored at the certain point in the initialization and the clock cycle value recorded upon the recognition.
    Type: Application
    Filed: March 18, 2014
    Publication date: September 24, 2015
    Applicants: STMicroelectronics S.r.l., STMicroelectronics International N.V.
    Inventors: Om Ranjan, Giampiero Borgonovo, Deepak Baranwal
  • Patent number: 9142322
    Abstract: An embodiment of a manager includes at least one input node configured to receive information regarding a region of an integrated circuit, and a determiner configured to determine, in response to the information, a likelihood that the region will cause an error. For example, the region may include a memory, and contents of the memory may be transferred to another, more reliable memory, if the likelihood that the memory will cause an error in the data that it stores equals or exceeds a likelihood threshold.
    Type: Grant
    Filed: August 12, 2013
    Date of Patent: September 22, 2015
    Assignee: STMicroelectronics International N.V.
    Inventors: Deepak Baranwal, Digvijay Pratap Singh, Kaushik Saha
  • Publication number: 20140047285
    Abstract: An embodiment of a manager includes at least one input node configured to receive information regarding a region of an integrated circuit, and a determiner configured to determine, in response to the information, a likelihood that the region will cause an error. For example, the region may include a memory, and contents of the memory may be transferred to another, more reliable memory, if the likelihood that the memory will cause an error in the data that it stores equals or exceeds a likelihood threshold.
    Type: Application
    Filed: August 12, 2013
    Publication date: February 13, 2014
    Applicant: STMicroelectronics International N.V.
    Inventors: Deepak BARANWAL, Digvijay Pratap SINGH, Kaushik SAHA
  • Patent number: 8185338
    Abstract: A low pin interface module is provided for testing an integrated circuit. The interface module includes an input-output module, a controlling module, a processing module and a storage module specific to the integrated circuit to be tested. The interface module reduces the required number of hardware pins in the integrated circuit for a standalone testing without limiting the integrated circuit testing features. A methodology and a control mechanism achieved with the interface module can be used for the standalone testing of any integrated circuit without using a Joint European Test Action Group test logic interface JTAG implemented following the IEEE Standard 1149.1-1990. The interface module is not limited by a particular debugging platform and allows access to all test features in the integrated circuit with a reduced number of hardware pins and thereby leading to enhanced testing speeds on a tester in parallel and a shorter time-to-a market cycle and a lower development cost.
    Type: Grant
    Filed: December 24, 2008
    Date of Patent: May 22, 2012
    Assignee: STMicroelectronics International N.V.
    Inventors: Rahul Hakoo, Chilakala Ravi Kumar, Deepak Baranwal
  • Publication number: 20090228231
    Abstract: A low pin interface module is provided for testing an integrated circuit. The interface module includes an input-output module, a controlling module, a processing module and a storage module specific to the integrated circuit to be tested. The interface module reduces the required number of hardware pins in the integrated circuit for a standalone testing without limiting the integrated circuit testing features. A methodology and a control mechanism achieved with the interface module can be used for the standalone testing of any integrated circuit without using a Joint European Test Action Group test logic interface JTAG implemented following the IEEE Standard 1149.1-1990. The interface module is not limited by a particular debugging platform and allows access to all test features in the integrated circuit with a reduced number of hardware pins and thereby leading to enhanced testing speeds on a tester in parallel and a shorter time-to-a market cycle and a lower development cost.
    Type: Application
    Filed: December 24, 2008
    Publication date: September 10, 2009
    Applicant: STMicroelectronics Pvt. Ltd.
    Inventors: Rahul Hakoo, Chilakala Ravi Kumar, Deepak Baranwal
  • Patent number: 7285980
    Abstract: A system and method for multiplexing an integrated circuit pin include a plurality of registers for storing bit values; a plurality of functions to be multiplexed on receiving the bit values; a decoding logic for decoding the bit values for selecting at least one of the functions; a plurality of pads connected to the plurality of functions and the decoding logic; and external pin/pins acting as inputs/outputs for the selected functionality depending upon the bit values.
    Type: Grant
    Filed: July 26, 2005
    Date of Patent: October 23, 2007
    Assignee: STMicroelectronics Pvt. Ltd.
    Inventors: Vishal Bansal, Deepak Baranwal
  • Publication number: 20060123292
    Abstract: A system and method for multiplexing an integrated circuit pin include a plurality of registers for storing bit values; a plurality of functions to be multiplexed on receiving the bit values; a decoding logic for decoding the bit values for selecting at least one of the functions; a plurality of pads connected to the plurality of functions and the decoding logic; and external pin/pins acting as inputs/outputs for the selected functionality depending upon the bit values.
    Type: Application
    Filed: July 26, 2005
    Publication date: June 8, 2006
    Applicant: STMicroelectronics Pvt. Ltd.
    Inventors: Vishal Bansal, Deepak Baranwal