Abstract: A live flaw detection system for a multi-bundled conductor splicing sleeve and an application method thereof are disclosed. The system includes an upper apparatus and a lower apparatus, where the upper apparatus includes an unmanned aerial vehicle and an industrial X-ray machine, and a laser sensor, and the lower apparatus includes a press plate frame apparatus, vertical screw slide table modules, a horizontal screw slide table module, a projection imager, and a linear retractable apparatus. The unmanned aerial vehicle functions as a power apparatus that controls the system to be online or offline, the industrial X-ray machine is configured to perform ray flaw detection on each splicing sleeve, the laser sensor is configured to guide the unmanned aerial vehicle to land the lower apparatus on splicing sleeves accurately, and the press plate frame apparatus is configured to fixedly clamp the splicing sleeves.

Abstract: The present invention discloses a plant light supplement lamp and lamp group and a light configuration system and method therefor, the plant light supplement lamp comprising: a mounting main body, which comprises a mounting main beam and an LED driver control box, wherein the LED driver control box is disposed on the mounting main beam and is provided with at least one LED driver and a plurality of interfaces; two dimming assemblies, which is disposed in the LED driver control box and correspondingly electrically connected to the LED driver; and a plurality of LED lamp tubes, which are correspondingly connected to the interfaces.

Abstract: An inspection device for a substrate includes a support member, a turning table and a first drive device. The turning table includes: a carrier pivotally mounted on a pivot shaft, the carrier having an observation aperture through its thickness direction; and positioning clamps which are mounted on the carrier and are used to retain the display substrate in the range of the observation aperture. The first drive device is in transmission connection with the pivot shaft of the carrier in order to drive the turning table to rotate around the pivot shaft. In use, an omnidirectional inspection of the display substrate can be achieved by turning the turning table. Moreover, the contact between the inspector and the display substrate can be avoided, the risk of damaging the display substrate during appearance inspection can be decreased, and therefore defects of the display substrate caused by appearance inspection can be reduced.

Abstract: The present disclosure relates to a technical field of display substrate inspection. The present disclosure discloses an inspection device and an inspection system for display substrate. The inspection device includes a support member, a turning table and a first drive device. The turning table includes: a carrier pivotally mounted on a pivot shaft, the carrier having an observation aperture through its thickness direction; and positioning clamps which are mounted on the carrier and are used to retain the display substrate in the range of the observation aperture. The first drive device is in transmission connection with the pivot shaft of the carrier in order to drive the turning table to rotate around the pivot shaft. When inspecting the appearance of the display substrate by the above mentioned inspection device, omnidirectional inspection of the display substrate can be achieved by turning the turning table.