Patents by Inventor Demetrios Michaelides

Demetrios Michaelides has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4325025
    Abstract: An apparatus for measuring the surface potential and impurity concentration in a semi-conductor body by monitoring the current flowing in a semiconductor body when the body is biased with a ramp voltage above its flat band voltage and summing the monitored current with the ramp voltage biasing the body. The apparatus provides direct measurement of surface potential and impurity concentration in a semiconductor structure and is especially useful in metal insulator semiconductor (MIS) structures.
    Type: Grant
    Filed: May 22, 1980
    Date of Patent: April 13, 1982
    Assignee: International Business Machines Corporation
    Inventors: Richard A. Corcoran, William A. Keenan, Demetrios Michaelides, Bob H. Yun