Patents by Inventor Deng Luo

Deng Luo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Single-event transient (SET) pulse measuring circuit capable of eliminating impact thereof, and integrated circuit chip
    Patent number: 11828788
    Abstract: The present disclosure discloses a Single-Event Transient (SET) pulse measuring circuit capable of eliminating impact thereof, and an integrated circuit chip. The SET pulse measuring circuit capable of eliminating impact thereof includes four parts: a SET pulse test chain, a latch circuit, a flip-flop test circuit, a latching self-trigger circuit. The integrated circuit chip is provided with a test chain module and two sets of SET pulse measuring circuits capable of eliminating impact thereof, and inputs of the two sets of SET pulse measuring circuits capable of eliminating impact thereof are the same and each are connected to an output terminal of the test chain module.
    Type: Grant
    Filed: June 29, 2022
    Date of Patent: November 28, 2023
    Assignee: National University of Defense Technology
    Inventors: Bin Liang, Xiaoyu Zhang, Yaqing Chi, Jianjun Chen, Hengzhou Yuan, Deng Luo
  • Single-Event Transient (SET) Pulse Measuring Circuit Capable of Eliminating Impact Thereof, and Integrated Circuit Chip
    Publication number: 20230008982
    Abstract: The present disclosure discloses a Single-Event Transient (SET) pulse measuring circuit capable of eliminating impact thereof, and an integrated circuit chip. The SET pulse measuring circuit capable of eliminating impact thereof includes four parts: a SET pulse test chain, a latch circuit, a flip-flop test circuit, a latching self-trigger circuit. The integrated circuit chip is provided with a test chain module and two sets of SET pulse measuring circuits capable of eliminating impact thereof, and inputs of the two sets of SET pulse measuring circuits capable of eliminating impact thereof are the same and each are connected to an output terminal of the test chain module.
    Type: Application
    Filed: June 29, 2022
    Publication date: January 12, 2023
    Applicant: National University of Defense Technology
    Inventors: Bin Liang, Xiaoyu Zhang, Yaqing Chi, Jianjun Chen, Hengzhou Yuan, Deng Luo