Abstract: A system for transferring a fluid sample in a fluid cell, includes a first and a second fluid circuit connected, respectively, to a first and a second inlet-outlet (1, 2) of a fluid cell (10), first injection elements (80) configured so as to inject, in series, into the first fluid circuit (11, 12, 13): a buffer solution, a first separation fluid volume followed by a fluid sample, then a second separation fluid volume and another buffer solution. The system includes first discharge elements arranged on the first fluid circuit near the first inlet-outlet (1), second injection elements (90, 91) arranged on the second fluid circuit (21, 22, 23) near the second inlet-outlet (2), and two-way circulation elements configured so as to circulate the fluid sample in two opposite directions in the fluid cell (10) without the passage of separation fluid into the fluid cell (10).

Abstract: An optical apparatus for Raman scattering microscopy includes a laser source that emits a laser beam at an excitation wavelength ?, a microscope objective that receives the laser beam and focuses the laser beam in an image plane of the microscope objective, the focused laser beam being intended to illuminate a sample, an optical system for collecting a Raman scattering optical beam, and detection elements suitable for detecting the Raman scattering beam collected. More particularly, the Raman scattering microscopy apparatus further includes an adaptive optics system positioned on an optical path of the Raman scattering beam, the said adaptive optics system is configured to form the image of an energy distribution inside the confocal hole on the entrance slit of the spectrometer in such a way as to obtain an energy distribution in a direction of a height of the slit.

Abstract: A system for transferring a fluid sample in a fluid cell, includes a first and a second fluid circuit connected, respectively, to a first and a second inlet-outlet (1, 2) of a fluid cell (10), first injection elements (80) configured so as to inject, in series, into the first fluid circuit (11, 12, 13): a buffer solution, a first separation fluid volume followed by a fluid sample, then a second separation fluid volume and another buffer solution. The system includes first discharge elements arranged on the first fluid circuit near the first inlet-outlet (1), second injection elements (90, 91) arranged on the second fluid circuit (21, 22, 23) near the second inlet-outlet (2), and two-way circulation elements configured so as to circulate the fluid sample in two opposite directions in the fluid cell (10) without the passage of separation fluid into the fluid cell (10).

Abstract: An optical apparatus for Raman scattering microscopy, includes a laser source (10) suitable for emitting a laser beam (11) at an excitation wavelength ?, a microscope objective (14) suitable for receiving the laser beam (11) and focusing the laser beam in an image plane of the microscope objective (14), the focused laser beam (21) being intended to illuminate a sample (20), an optical system suitable for collecting a Raman scattering optical beam (22), and detection elements (16, 17) suitable for detecting the Raman scattering beam (22) collected. More particularly, the Raman scattering microscopy apparatus further includes an adaptive optics system (31, 32, 33) positioned on an optical path of the excitation laser beam (11), on an optical path of the Raman scattering beam (22) or on an optical path common to the excitation laser beam (11) and the Raman scattering beam (22).

Abstract: A spectroscopic polarimetric system of broad spectral range, includes a light source suitable for emitting an incident light beam over a wavelength range, a polarization state generator (PSG), a polarization state analyzer (PSA), and a detector. The PSG and the PSA have respective elements for modulating the polarization of the light beam. The elements of the PSG for modulating polarization are suitable for generating a sequence of m polarization states with m>4 at each measurement wavelength, the elements of the PSA for modulating polarization are suitable for determining a sequence of n polarization states with n>4 for each measurement wavelength, and the detector elements are suitable for acquiring a sequence of N measurements with 16<N?n×m at each wavelength to extract therefrom a polarimetric spectroscopic measurement of the Mueller matrix of the sample. An extended spectroscopic polarimetric measurement method is also described.

Abstract: A system and process for analyzing a sample includes an excitation section and an analyze section, said excitation section including a light source emitting an incident measurement luminous beam, a polarization state generator (PSG), first optics, and said analyze section includes a polarization state analyzer (PSA), a detection system and second optics. The excitation section includes an illumination source emitting an incident visualization luminous beam, superposition optics that direct the incident visualization luminous beam toward the sample surface along an optical axis which is identical to the optical axis of the incident measurement luminous beam and the analyze section includes separation optics that transmit a part of the reflected or transmitted visualization luminous beam and a part of the reflected or transmitted measurement luminous beam towards a visualization direction.

Abstract: A spectroscopic polarimetric system of broad spectral range, includes a light source suitable for emitting an incident light beam over a wavelength range, a polarization state generator (PSG), a polarization state analyzer (PSA), and a detector. The PSG and the PSA have respective elements for modulating the polarization of the light beam. The elements of the PSG for modulating polarization are suitable for generating a sequence of m polarization states with m>4 at each measurement wavelength, the elements of the PSA for modulating polarization are suitable for determining a sequence of n polarization states with n>4 for each measurement wavelength, and the detector elements are suitable for acquiring a sequence of N measurements with 16<N?n×m at each wavelength to extract therefrom a polarimetric spectroscopic measurement of the Mueller matrix of the sample. An extended spectroscopic polarimetric measurement method is also described.

Abstract: A system and process for analyzing a sample includes an excitation section and an analyze section, said excitation section including a light source emitting an incident measurement luminous beam, a polarisation state generator (PSG), first optics, and said analyze section includes a polarisation state analyzer (PSA), a detection system and second optics. The excitation section includes an illumination source emitting an incident visualization luminous beam, superposition optics that direct the incident visualization luminous beam toward the sample surface along an optical axis which is identical to the optical axis of the incident measurement luminous beam and the analyze section includes separation optics that transmit a part of the reflected or transmitted visualization luminous beam and a part of the reflected or transmitted measurement luminous beam towards a visualization direction.

Abstract: Disclosed is an achromatic spectroscopic ellispometer for analyzing small regions of a sample over a wide range of wavelengths from ultraviolet (UV) to infrared (IR). The spectroscopic ellipsometer contains a light source emitting a light beam which passes through a polarisation state generator section before being focused at an incidence angle q by a first parabolic mirror to a small spot on a sample. A second parabolic mirror collects the reflected beam and connects said beam to an analyzing section. The reflected beam emerges from the analyzing section and is spectroscopically detected and analyzed. The light beam through the polarisation state generator section up to the first parabolic mirror and the light beam from the second mirror through the analyzing section are parallel enabling achromatism. The incidence angle q is largely varied without shifting of the location of the small spot on the sample surface.

Abstract: The invention concerns an achromatic spectroscopic ellipsometer for analysing small regions of a sample (1) over a wide range of wavelengths from ultraviolet (UV) to infrared (IR). The spectroscopic ellipsometer contains a light source (2) emitting a light beam (3). The light beam (3) goes through a polarisation state generator section (4) before being focused at an incidence angle q by a first parabolic mirror (5) to a small spot on sample (1). A second parabolic mirror (6) collects the reflected beam (16) and connects said beam to an analysing section (7). The reflected beam (16) emerges from the analysing section (7) to go to means (8) for detecting and analysing a spectroscopically said beam. According to the invention, the light beam (3) through the polarisation state generator section (4) up to the first parabolic mirror (5) and the light beam from the second mirror (6) through the analysing section (7) are parallel enabling achromatism.