Abstract: A system for measuring deformations of an area of a structural element, includes at least one gauge including a rigid substrate on the upper surface of which is arranged at least one pattern of a material capable of being deformed and delivering a signal representative of the deformations the substrate is arranged to transmit, to the pattern, the deformations of the area when the lower surface of the substrate is attached to the area. The system includes a deformable element and a device for compression of the element on the upper surface of the substrate so that the substrate can be moved by the deformations of the area. The system also includes an arrangement for attachment of the compression device on the structural element, in which the attachment arrangement is intended to ensure that the substrate is held on the area by the deformable element, which is compressed on the upper surface of the substrate.