Patents by Inventor Dennis HUSSEY

Dennis HUSSEY has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • METHOD FOR MEASURING SURFACE CHARACTERISTICS IN OPTICALLY DISTORTING MEDIA
    Publication number: 20240044641
    Abstract: Provided is a method for measuring surface characteristics of at least a portion of an object, including providing a light source; generating a first interference pattern on the at least a portion of the object; capturing an image of the first interference pattern; shifting the phase of the light source to generate a second interference pattern; capturing an image of the second interference pattern; filtering distortion from the interference patterns; extracting a wrapped phase of the at least a portion of the object based on the images; unwrapping the wrapped phase of the at least a portion of the object to generate an unwrapped phase; identifying a computed depth map distance to the at least a portion of the object; and fitting an ideal part to the computed depth map of the at least a portion of the object to measure the surface characteristics.
    Type: Application
    Filed: October 15, 2023
    Publication date: February 8, 2024
    Inventors: David STOUTAMIRE, Dennis HUSSEY
  • METHOD FOR MEASURING SURFACE CHARACTERISTICS IN OPTICALLY DISTORTING MEDIA
    Publication number: 20210389124
    Abstract: Provided is a method for measuring surface characteristics of at least a portion of an object, including providing a light source; generating a first interference pattern on the at least a portion of the object; capturing an image of the first interference pattern; shifting the phase of the light source to generate a second interference pattern; capturing an image of the second interference pattern; filtering distortion from the interference patterns; extracting a wrapped phase of the at least a portion of the object based on the images; unwrapping the wrapped phase of the at least a portion of the object to generate an unwrapped phase; identifying a computed depth map distance to the at least a portion of the object; and fitting an ideal part to the computed depth map of the at least a portion of the object to measure the surface characteristics.
    Type: Application
    Filed: October 12, 2018
    Publication date: December 16, 2021
    Inventors: David STOUTAMIRE, Dennis HUSSEY