Patents by Inventor Dennis Lavery

Dennis Lavery has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20060058428
    Abstract: Fluorinated vinyl ether-epoxides which are fluorinated compounds containing both vinyl ether and epoxide functionalities, a process for making them and their uses. The fluorinated vinyl ether-epoxide compounds have the formula wherein X and Y are independently H, a halogen, or a linear or branched C1 to C12 fluoroalkyl group; and Rf is a linear or branched C1 to C12 fluoroalkyl group or a halogen.
    Type: Application
    Filed: September 16, 2004
    Publication date: March 16, 2006
    Inventors: Haridasan Nair, David Nalewajek, Dennis Lavery
  • Publication number: 20060008730
    Abstract: Monomers and polymers useful for forming photoresists are provided. More particularly, photoresists, as well as monomers and polymers for photoresists useful in micro-lithography, specifically monomers bearing acid-labile groups of reduced optical density. The resulting photoresists exhibit improved transparency to 157 nm light. The photoresist compositions are composed of a mixture of at least one water insoluble, acid decomposable polymer which is prepared from at least one monomeric unit which comprises an acid labile group of the formula —OC(CH3)2CF3 and which is substantially transparent to ultraviolet radiation at a wavelength of about 157 nm and at least one photoacid generator capable of generating an acid upon exposure to sufficient activating energy at a wavelength of about 157 nm.
    Type: Application
    Filed: July 9, 2004
    Publication date: January 12, 2006
    Inventors: Michael Puy, Haridasan Nair, Jingji Ma, David Nalewajek, Andrew Poss, Leonard Stachura, Lawrence Ford, Dennis Lavery
  • Publication number: 20060008731
    Abstract: Monomers and polymers useful for forming photoresists. More particularly, photoresists, as well as monomers and polymers for photoresists useful in micro-lithography, specifically monomers bearing acid-labile groups of reduced optical density. The resulting photoresists exhibit improved transparency to 157 nm light. The photoresist compositions are composed of a mixture of at least one water insoluble, acid decomposable polymer which is prepared from at least one monomer having a monomeric unit structure which comprises: where Hal=F, Cl or Br and X=H or F; and which is substantially transparent to ultraviolet radiation at a wavelength of about 157 nm, and at least one photoacid generator capable of generating an acid upon exposure to sufficient activating energy at a wavelength of about 157 nm.
    Type: Application
    Filed: July 9, 2004
    Publication date: January 12, 2006
    Inventors: Michael Van Der Puy, Jingji Ma, Dennis Lavery, Lawrence Ford, Haridasan Nair, David Nalewajek, Andrew Poss, Leonard Stachura