Patents by Inventor Dennis Lee Doane

Dennis Lee Doane has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods for measuring DMD low frequency spatial uniformity
    Patent number: 6922483
    Abstract: Methods for measuring the low spatial reflectivity uniformity of a DMD spatial light modulator. These methods are unique since they compensate for the non-uniformities introduced by the tilt angle of the DMD mirrors in addition to the normal system non-uniformities introduced by the illumination source and optics. These methods flatten the image and remove all but the low spatial non-uniformities from the DMD mirrors.
    Type: Grant
    Filed: December 21, 2000
    Date of Patent: July 26, 2005
    Assignee: Texas Instruments Incorporated
    Inventor: Dennis Lee Doane
  • Methods for measuring DMD low frequency spatial uniformity
    Publication number: 20010031078
    Abstract: Methods for measuring the low spatial reflectivity uniformity of a DMD spatial light modulator. These methods are unique since they compensate for the non-uniformities introduced by the tilt angle of the DMD mirrors in addition to the normal system non-uniformities introduced by the illumination source and optics. These methods flatten the image and remove all but the low spatial non-uniformities from the DMD mirrors.
    Type: Application
    Filed: December 21, 2000
    Publication date: October 18, 2001
    Inventor: Dennis Lee Doane
  • Apparatus and method for identifying defective objects
    Patent number: 5987161
    Abstract: A device (10) identifies a defective object (12) from an image of the object (12) stored as pixel data in a pixel-data memory (52, 54, 56, 58). An inspection-point memory (72, 74, 76, 78) stores inspection-point data for the object (12). The inspection-point data represents inspection points (122, 124, . . . ) that are arranged in circuital (112, 136) and transverse (110) groups, where member inspection points of the circuital groups (112, 136) are also members of different ones of the transverse groups (110). A program memory (84) stores a program, which is executed by a processor (64, 66, 68, 70).
    Type: Grant
    Filed: June 30, 1994
    Date of Patent: November 16, 1999
    Assignee: Texas Instruments Incorporated
    Inventors: Dennis Lee Doane, Rajiv Roy, Charles K. Harris, Joe Douglas Woodall, Thomas J. Doty