Abstract: A leak-testing technique and apparatus for differential pressure sensor arrays is provided. A reference pressure sensor array is provided, wherein a seal is disposed between the reference pressure sensor array and a target differential pressure sensor array. A probe socket is utilized to communicate with each individual sensor in the reference pressure sensor array. The target pressure sensor array and the reference pressure sensor array are sealed via a pressure plate and plunger assembly. The target pressure sensor array, seal, and reference pressure sensor array are exposed to a first pressure. The target differential pressure sensor array, seal, and reference pressure sensor array are then exposed to a second pressure. The probe socket verifies that all reference pressure sensors continue to output the first pressure. If the probe socket identifies a reference pressure sensor that reads the second pressure, then the corresponding target pressure sensor is identified as being defective because of leakage.

Abstract: A technique for manufacturing an integrated pressure sensor includes a number of steps. Initially, a substrate with conductive electrical traces located on first and second sides of the substrate is provided. A plurality of compensation circuits are positioned in an array on the first side of the substrate in electrical contact with one or more of the conductive electrical traces on the first side of the substrate. A plurality of pressure sensors are positioned on the second side of the substrate in electrical contact with one or more of the conductive electrical traces on the second side of the substrate. Each one of the sensors is associated with one of the compensation circuits to form a plurality of pressure sensor-compensation circuit pairs. The substrate includes conductive vias to electrically connect each of the sensor-compensation circuit pairs. Each of the compensation circuits provides temperature compensation for an associated one of the sensors.

Abstract: A pressure sensor module is provided with an isolation platform which isolates stress. The pressure sensor module includes a base structure and a cantilever member formed in the base structure by an isolation gap. A pressure sensing element is located on the cantilever member such that the cantilever member provides stress isolation to the pressure sensing element.

Abstract: In accordance with the teachings of the present invention, a temperature dependent voltage generator circuit is provided for generating an output voltage that changes proportionally with changes in the operating temperature of the temperature dependent voltage generator circuit. The temperature dependent voltage generator circuit includes binary weighted current sources and electronic switches that are selectively closed in order to produce a binary weighted current. The binary weighted current is adjustable such that the output voltage of the temperature dependent voltage generator circuit may be "nulled" or forced to zero at any given operating temperature.

Abstract: A "zener-zap" memory cell with pretest capability for testing effects that would be realized from permanently programming the memory cell is provided. The memory cell is addressable and provides a binary signal at an output. The memory cell uses a zener diode as a memory element which is permanently programmed when selectively coupled to a programming voltage which exceeds the reverse breakdown voltage of the zener diode. The memory cell has a test circuit for generating the programmed binary signal at the output of the memory cell prior to permanently programming the zener diode and when coupled to a pretest voltage.

Abstract: In accordance with the teachings of the present invention, a programmable integrated transducer amplifier circuit is provided which receives differential outputs from a transducer, such as a pressure or accelerometer transducer. The programmable integrated transducer amplifier circuit includes binary adjustable circuits that are programmed in response to binary coded signals. The binary adjustable circuits generate binary weighted currents that are employed to adjust the operating characteristics of the amplifier circuit. The binary coded signals are received from a programmable memory array which includes a plurality of memory cells that store binary information. Each of the memory cells are programmed when coupled to a programming signal. Additionally, the memory array has pretest capability for testing outputs of the memory cells prior to permanently programming the respective memory cells.

Abstract: A stackable voltage comparator circuit that may be used in an analog voltage address decoder circuit for performing voltage window comparisons. The voltage comparator circuit includes a plurality of voltage comparator circuit cells, each of which includes a differential input stage made up of a pair of transistors which receives a current source. A first comparator circuit cell includes a differential input pair of transistors with one of the transistors having a first collector and a second collector, with the second collector being coupled to an output line. The first comparator circuit cell compares an input window with a first threshold voltage and produces an output at the output line. A second comparator circuit cell compares the input voltage with a second threshold voltage and includes a second differential input pair of transistors.

Abstract: An adjustable temperature dependent current generator includes a transconductance current multiplier, a current mirror, two temperature dependent current generating circuits and a current source to generate currents capable of having an adjustable linear relation to temperature.

Abstract: A temperature compensation circuit for a device with a voltage output affected by temperature in a predetermined manner and a null output for which the voltage is zero regardless of temperature comprises a voltage to current converter responsive to the generated voltage to produce a proportional current, a current generator comprising elements responsive to the temperature of the device to generate a pair of compensation currents varying therewith in a predetermined manner so that the ratio of the compensation currents embodies a desired temperature compensation, and a transconductance multiplier effective to multiply the proportional current by the ratio of the compensation currents to generate a compensated output current. It may further comprise a current to voltage converter responsive to the compensated output current to produce a compensated output voltage.

Abstract: A bipolar integrated circuit differential voltage to current converter comprises a current source and a current sink at a lower current with two parallel branches connected therebetween. Each branch comprises, from the current source, a resistor, an input transistor with an emitter connected to the resistor and a mirror transistor with an emitter connected to the current sink. The resistors have equal resistance; the input transistors have bases comprising a differential voltage input; and the mirror transistors are connected in a current mirror arrangement. An output current is taken from the junction the resistor and the emitter of the input transistor connected thereto on the output side of the mirror so as to allow the current mirror to maintain equal currents and thus equal base/emitter voltages in the input transistors.

Abstract: A pressure sensor includes a three part package including a housing member defining two spaced-apart chambers, a bottom member providing the bottom wall of one of the chambers, and a top cover member hermetically sealing the two chambers from one another and including a port for admission of gases into one of the chambers. A pressure sensing element is disposed in the chamber having the port and mounted on the bottom member, and a signal processing element is mounted in the other chamber. Electrical connections between the two elements are by means of leads which extend into each chamber and pass through a wall separating the chambers. A low temperature differential between the two elements is provided by extending one of the leads from the other one chamber to a position directly underlying and in intimate contact with the bottom surface of the processing element in the other chamber.