Patents by Inventor Dennis M. Sylvester

Dennis M. Sylvester has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9075675
    Abstract: A data processing apparatus is provided for producing a randomized value. A cell in the data processing apparatus comprises a dielectric oxide layer and stress voltage circuitry is configured to apply a stress voltage across the dielectric oxide layer of the cell to cause an oxide breakdown process to occur. Oxide breakdown detection circuitry is configured to determine a current extent of the oxide breakdown process by measuring a response of the dielectric oxide layer to the stress voltage and randomized value determination circuitry is configured to determine a randomized value in dependence on the current extent of the oxide breakdown process.
    Type: Grant
    Filed: June 2, 2011
    Date of Patent: July 7, 2015
    Assignee: The Regents of the University of Michigan
    Inventors: Nurrachman Chih Yeh Liu, Scott M Hanson, Nathaniel Pinckney, David T Blaauw, Dennis M. Sylvester
  • Patent number: 8930427
    Abstract: A data processing apparatus is provided for producing a randomized value. A cell in the data processing apparatus comprises a dielectric oxide layer and stress voltage circuitry is configured to apply a stress voltage across the dielectric oxide layer of the cell to cause an oxide breakdown process to occur. Oxide breakdown detection circuitry is configured to determine a current extent of the oxide breakdown process by measuring a response of the dielectric oxide layer to the stress voltage and randomized value determination circuitry is configured to determine a randomized value in dependence on the current extent of the oxide breakdown process.
    Type: Grant
    Filed: June 2, 2011
    Date of Patent: January 6, 2015
    Assignee: The Regents of the University of Michigan
    Inventors: Nurrachman Chih Yeh Liu, Scott M Hanson, Nathaniel Pinckney, David T Blaauw, Dennis M. Sylvester
  • Patent number: 8381155
    Abstract: A method of generating valid vertical interconnect positions for a multiple layer integrated circuit including multiple layers stacked vertically above one another and having a bonding interface between at least one pair of layers. The interface is formed by the coupling of a pair of conductive bond patterns formed on facing surfaces of the pair of layers. The method includes defining a candidate transformation origin, defining a sub-region which tessellates across the patterns, applying a predetermined transformation to the patterns at the bonding interface, determining the validity of the candidate transformation origin in dependence on coincidence of at least a subset of the patterns with the transformed patterns, selecting a valid transformation origin, and defining a set of valid vertical interconnect positions associated with the valid transformation origin at positions in the bonding interface where the original and transformed patterns coincided with each other.
    Type: Grant
    Filed: October 3, 2011
    Date of Patent: February 19, 2013
    Assignee: The Regents of the University of Michigan
    Inventors: David A. Fick, Ronald G. Dreslinski, Trevor N. Mudge, David T. Blaauw, Dennis M. Sylvester
  • Publication number: 20120030268
    Abstract: A data processing apparatus is provided for producing a randomized value. A cell in the data processing apparatus comprises a dielectric oxide layer and stress voltage circuitry is configured to apply a stress voltage across the dielectric oxide layer of the cell to cause an oxide breakdown process to occur. Oxide breakdown detection circuitry is configured to determine a current extent of the oxide breakdown process by measuring a response of the dielectric oxide layer to the stress voltage and randomized value determination circuitry is configured to determine a randomized value in dependence on the current extent of the oxide breakdown process.
    Type: Application
    Filed: June 2, 2011
    Publication date: February 2, 2012
    Applicant: University of Michigan
    Inventors: Nurrachman Chih Yeh Liu, Scott M. Hanson, Nathaniel Pinckney, David T. Blaauw, Dennis M. Sylvester
  • Patent number: 6919619
    Abstract: A system and method is provided that improves the propagation characteristics of an electrical conducting signal wire on an integrated circuit. The system includes a pair of parallel shielding wires positioned on opposite longitudinal sides of the signal wire. A shielding signal is applied to the shielding wires. The shielding signal is out of phase with the signal of interest propagated on the signal wire.
    Type: Grant
    Filed: February 28, 2003
    Date of Patent: July 19, 2005
    Assignee: The Regents of the University of Michigan
    Inventors: Dennis M. Sylvester, Himanshu Kaul, David T. Blaauw
  • Patent number: 6870402
    Abstract: An improved receiver circuit for use on an integrated chip is disclosed. The receiver circuit is interposed in an interconnect line between electrical components in an integrated circuit. The receiver circuit has a transition detection circuit that generates a transition signal in response to a detection of a transition from a first state to a second state on the interconnect line and further generates the transition signal in response to a detection of a transition from the second state to the first state on said interconnect line. The receiver further includes an output signal control circuit that, in response to the transition signal, selectively outputs either a present state of said interconnect line or a next state of the interconnect line stored in the receiver.
    Type: Grant
    Filed: March 14, 2003
    Date of Patent: March 22, 2005
    Assignee: The Regents of the University of Michigan
    Inventors: Dennis M. Sylvester, Himanshu Kaul
  • Publication number: 20040169260
    Abstract: A system and method is provided that improves the propagation characteristics of an electrical conducting signal wire on an integrated circuit. The system includes a pair of parallel shielding wires positioned on opposite longitudinal sides of the signal wire. A shielding signal is applied to the shielding wires. The shielding signal is out of phase with the signal of interest propagated on the signal wire.
    Type: Application
    Filed: February 28, 2003
    Publication date: September 2, 2004
    Inventors: Dennis M. Sylvester, Himanshu Kaul, David T. Blaauw