Patents by Inventor Dennis Montierth

Dennis Montierth has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatuses, systems, and methods for identifying multi-bit errors
    Patent number: 11646751
    Abstract: Apparatuses, systems, and methods for multi-bit error detection. A memory device may store data bits and parity bits in a memory array. An error correction code (ECC) circuit may generate syndrome bits based on the data and parity bits and use the syndrome bits to correct up to a single bit error in the data and parity bits. A multi-bit error (MBE) detection circuit may detect an MBE in the data and parity based on at least one of the syndrome bits or the parity bits. For example, the MBE detection circuit may determine if the syndrome bits have a mapped or unmapped state and/or may compare the parity bits, data bits, and an additional parity bit to determine if there is an MBE. When an MBE is detected an MBE signal is activated. In some embodiments, an MBE flag may be set based on the MBE signal being active.
    Type: Grant
    Filed: June 15, 2021
    Date of Patent: May 9, 2023
    Assignee: Micron Technology, Inc.
    Inventors: Markus H. Geiger, Matthew A. Prather, Sujeet Ayyapureddi, C. Omar Benitez, Dennis Montierth
  • APPARATUSES, SYSTEMS, AND METHODS FOR IDENTIFYING MULTI-BIT ERRORS
    Publication number: 20220399902
    Abstract: Apparatuses, systems, and methods for multi-bit error detection. A memory device may store data bits and parity bits in a memory array. An error correction code (ECC) circuit may generate syndrome bits based on the data and parity bits and use the syndrome bits to correct up to a single bit error in the data and parity bits. A multi-bit error (MBE) detection circuit may detect an MBE in the data and parity based on at least one of the syndrome bits or the parity bits. For example, the MBE detection circuit may determine if the syndrome bits have a mapped or unmapped state and/or may compare the parity bits, data bits, and an additional parity bit to determine if there is an MBE. When an MBE is detected an MBE signal is activated. In some embodiments, an MBE flag may be set based on the MBE signal being active.
    Type: Application
    Filed: June 15, 2021
    Publication date: December 15, 2022
    Applicant: Micron Technology, Inc.
    Inventors: Markus H. Geiger, Matthew A. Prather, Sujeet Ayyapureddi, C. Omar Benitez, Dennis Montierth
  • Methods and apparatuses for stacked device testing
    Patent number: 9496050
    Abstract: Various embodiments include apparatus, systems, and methods having multiple dies arranged in a stack in which the dies or a logic chip in communication with the dies stores a flag for indicating whether a threshold number of cells of the dies have failed during test operations.
    Type: Grant
    Filed: May 22, 2013
    Date of Patent: November 15, 2016
    Assignee: Micron Technology, Inc.
    Inventors: Boon Hor Lam, Dennis Montierth
  • METHODS AND APPARATUSES FOR STACKED DEVICE TESTING
    Publication number: 20140347944
    Abstract: Various embodiments include apparatus, systems, and methods having multiple dies arranged in a stack in which the dies or a logic chip in communication with the dies stores a flag for indicating whether a threshold number of cells of the dies have failed during test operations.
    Type: Application
    Filed: May 22, 2013
    Publication date: November 27, 2014
    Applicant: Micron Technology, Inc.
    Inventors: Boon Hor Lam, Dennis Montierth