Abstract: A circuit board test apparatus includes an interchangeable interface board adapted for use with a particular type of circuit board to be tested, a receiver board with which said interface board engages, a back plane board located generally parallel to said receiver board and containing analog and digital buses, and a plurality of analog and digital interface and controller boards mounted generally perpendicular to said receiver and said back plane boards and electrically connected thereto. The test apparatus also includes vacuum apparatus for drawing the circuit board to be tested into engagement with the interchangeable interface board and further includes several embodiments of means for directing a stream of ionized air across the circuit board to be tested to eliminate static electrical charges therefrom.

Abstract: A fixture for testing plated-through holes of a printed circuit board includes a probe board having a plurality of first spring-actuated probe assemblies arranged in a matrix on a uniform rectangular grid, a converter board having a plurality of second spring-actuated probe assemblies arranged to engage the plated-through holes of the printed circuit board being tested, the converter board having copper tracks located on its lower surface connecting the second probe assemblies with the first probe assemblies and an elastic cover member positioned over the fixture to provide an air-tight seal when vacuum is applied to move the printed circuit board and the converter board in a direction to move the first and second probe assemblies into engagement with the copper tracks and the plated-through holes respectively enabling the plated-through holes to be tested for continuity.