Abstract: A lift apparatus configured to move a passenger platform of the lift apparatus between a first position and an elevated second position. A stairway of the example lift apparatus may be used as a stairway when the passenger platform is arranged in the first position. As the passenger platform is raised to the elevated second position, hinged steps of the stairway are transformed into a horizontal surface.

Abstract: A lift apparatus configured to move a passenger platform of the lift apparatus between a first position and an elevated second position. A stairway of the example lift apparatus may be used as a stairway when the passenger platform is arranged in the first position. As the passenger platform is raised to the elevated second position, hinged steps of the stairway are transformed into a horizontal surface.

Abstract: A contact for use in a test set which can be mounted to a load board of a tester apparatus. The contact, which serves to electrically connect at least one lead of a device being tested with a corresponding metallic trace on the load board, has a first end defining multiple contact points. As the contact is rotated about an axis generally perpendicular to a plane defined by the contact, successive contact points are sequentially engaged by a lead of the device being tested.

Abstract: An actuator device applies force to an integrated circuit package to enable temporary contact between a plurality of contacts on the integrated circuit package and to a set of test contacts carried on a contactor mounted on a circuit board. A cover is hinged at one side, and rotates to position that allows an actuator element to apply force through a lead backer to the integrated circuit package or its leads, pressing the integrated circuit contacts against the test contacts. A latch opposite to the hinge holds the cover in the closed position. An interlock mechanism may be provided to prevent operating the latch unless the actuator element has withdrawn the lead backer from the integrated circuit or its leads, thereby preventing damage to components.

Abstract: An improved test socket for use in testing integrated circuits. The test socket includes a housing having one or more slots formed therein. Contacts can be received within respective slots and maintained therein with rear ends of the contacts in engagement with traces on a load board. Mounting is accomplished by means of a pair of elastomers, and the elastomers maintain each contact such that, when the front end of a contact is engaged by the lead or pad of the device to be tested and urged into its corresponding slot, an arcuate surface at a rear end of each contact rolls across its corresponding trace with virtually no translational or rotational sliding.

Abstract: An actuator for pressing a plurality of circuit contacts carried on a microcircuit package against a plurality of test contacts has a frame having a top surface and a bottom surface facing away from the top surface. The frame has first and second end slots each intersecting the top surface at opposite ends thereof. A loader foot is carried by the frame's bottom surface for applying force to a microcircuit. First and second latch elements, each respectively mounted within the frame's first and second end slots are each shiftable between a latched position and an unlatched position within the frame's first and second slots, each said latch element when in the latched position for gripping an edge of an alignment plate and when in the unlatched position for releasing the alignment plate. An actuator element mounted on the frame's top surface receives manual force and converts the received manual force to force applied to the latch elements to shift the latch elements between the latched and unlatched positions.