Patents by Inventor Denzil Savio Fernandes

Denzil Savio Fernandes has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Scan testing with capture clock generator driven by clock distribution network
    Patent number: 8607108
    Abstract: An electronic system is configured for scan testing, with a clock distribution network going to a plurality of blocks of the system, and a test capture clock being generated locally at each block. Capture clock pulses are optionally generated at different times for different blocks, and are optionally suppressed for some blocks.
    Type: Grant
    Filed: August 8, 2011
    Date of Patent: December 10, 2013
    Assignee: Texas Instruments Incorporated
    Inventor: Denzil Savio Fernandes
  • SCAN TESTING
    Publication number: 20130038371
    Abstract: An electronic system is configured for scan testing, with a clock distribution network going to a plurality of blocks of the system, and a test capture clock being generated locally at each block. Capture clock pulses may optionally be generated at different times for different blocks, and may optionally be suppressed for some blocks.
    Type: Application
    Filed: August 8, 2011
    Publication date: February 14, 2013
    Applicant: Texas Instruments Incorporated
    Inventor: Denzil Savio Fernandes
  • Micropipeline stage controller and control scheme
    Patent number: 7380153
    Abstract: A technique for controlling local events in two-phase asynchronous handshake circuits.
    Type: Grant
    Filed: January 21, 2005
    Date of Patent: May 27, 2008
    Assignee: Texas Instruments Incorporated
    Inventors: Sam Brandon Sandbote, Denzil Savio Fernandes