Patents by Inventor DeokWoo Nam

DeokWoo Nam has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Semiconductor device and method for improved antenna testing
    Patent number: 12092676
    Abstract: A semiconductor device is tested by disposing an antenna-in-package (AiP) module under a test antenna. A first signal is transmitted with a first antenna of the AiP module. The test antenna is moved to a power output peak of the first signal. A second signal is transmitted with a second antenna of the AiP module. The test antenna is moved along a first directional axis from the power output peak of the first signal to a power output peak of the second signal while a second directional axis of the test antenna is held static. The first antenna of the AiP module is tested while the test antenna is at the power output peak of the first signal. The second antenna of the AiP module is tested while the test antenna is at the power output peak of the second signal.
    Type: Grant
    Filed: September 27, 2022
    Date of Patent: September 17, 2024
    Assignee: JCET STATS ChipPAC Korea Limited
    Inventors: JinHyeok Song, DeokWoo Nam, YoungEun Seo
  • Semiconductor Device and Method for Improved Antenna Testing
    Publication number: 20240103058
    Abstract: A semiconductor device is tested by disposing an antenna-in-package (AiP) module under a test antenna. A first signal is transmitted with a first antenna of the AiP module. The test antenna is moved to a power output peak of the first signal. A second signal is transmitted with a second antenna of the AiP module. The test antenna is moved along a first directional axis from the power output peak of the first signal to a power output peak of the second signal while a second directional axis of the test antenna is held static. The first antenna of the AiP module is tested while the test antenna is at the power output peak of the first signal. The second antenna of the AiP module is tested while the test antenna is at the power output peak of the second signal.
    Type: Application
    Filed: September 27, 2022
    Publication date: March 28, 2024
    Applicant: JCET STATS ChipPAC Korea Limited
    Inventors: JinHyeok Song, DeokWoo Nam, YoungEun Seo